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HN1D01FU(T5LN-CN,F PDF预览

HN1D01FU(T5LN-CN,F

更新时间: 2024-10-30 16:37:11
品牌 Logo 应用领域
东芝 - TOSHIBA 超快恢复二极管快速恢复二极管测试光电二极管
页数 文件大小 规格书
4页 240K
描述
Rectifier Diode, 4 Element, 0.1A, 85V V(RRM), Silicon

HN1D01FU(T5LN-CN,F 技术参数

生命周期:Obsolete包装说明:R-PDSO-G6
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8541.10.00.70风险等级:5.67
应用:ULTRA FAST RECOVERY配置:2 BANKS, COMMON ANODE, 2 ELEMENTS
二极管元件材料:SILICON二极管类型:RECTIFIER DIODE
最大正向电压 (VF):1.2 VJESD-30 代码:R-PDSO-G6
最大非重复峰值正向电流:2 A元件数量:4
相数:1端子数量:6
最高工作温度:125 °C最大输出电流:0.1 A
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:SMALL OUTLINE最大功率耗散:0.2 W
最大重复峰值反向电压:85 V最大反向电流:0.5 µA
最大反向恢复时间:0.004 µs反向测试电压:80 V
表面贴装:YES端子形式:GULL WING
端子位置:DUALBase Number Matches:1

HN1D01FU(T5LN-CN,F 数据手册

 浏览型号HN1D01FU(T5LN-CN,F的Datasheet PDF文件第2页浏览型号HN1D01FU(T5LN-CN,F的Datasheet PDF文件第3页浏览型号HN1D01FU(T5LN-CN,F的Datasheet PDF文件第4页 
HN1D01FU  
TOSHIBA Diode Silicon Epitaxial Planar Type  
HN1D01FU  
Ultra High Speed Switching Application  
Unit: mm  
z Small package  
z Low forward voltage:  
VF (3) = 0.92 V (typ.)  
z Fast reverse recovery time: trr = 1.6 ns (typ.)  
z Small total capacitance: CT = 2.2 pF (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Symbol  
Rating  
Unit  
Maximum (peak) reverse voltage  
Reverse voltage  
V
85  
80  
V
V
RM  
V
R
Maximum (peak) forward current  
Average forward current  
Surge current (10ms)  
Power dissipation  
I
300*  
100*  
2*  
mA  
mA  
A
FM  
I
O
I
FSM  
P
200  
mW  
°C  
°C  
Junction temperature  
T
j
125  
Storage temperature  
T
55 to 125  
stg  
JEDEC  
JEITA  
Note: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
1-2T1A  
TOSHIBA  
Weight: 6.8 mg (typ.)  
temperature, etc.) may cause this product to decrease in the  
reliability significantly even if the operating conditions (i.e. operating  
temperature/current/voltage, etc.) are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
*: This is the Absolute Maximum Ratings of single diode (Q1, Q2, Q3 or Q4).  
In the case of using Unit 1 and Unit 2 independently or simultaneously, the Absolute Maximum Ratings per diode  
is 75% of the single diode one.  
Electrical Characteristics (Q1, Q2, Q3, Q4 Common, Ta = 25°C)  
Test  
Circuit  
Characteristics  
Symbol  
Test Condition  
= 1 mA  
Min  
Typ.  
Max  
Unit  
V
V
V
V
I
I
I
0.61  
0.74  
0.92  
F (1)  
F (2)  
F (3)  
R (1)  
R (2)  
F
F
F
Forward voltage  
= 10 mA  
= 100 mA  
1.20  
0.1  
0.5  
4.0  
4.0  
I
I
V
V
V
= 30 V  
R
R
R
Reverse current  
μA  
= 80 V  
Total capacitance  
C
T
= 0, f = 1 MHz  
2.2  
1.6  
pF  
ns  
Reverse recovery time  
t
I
= 10 mA (fig.1)  
F
rr  
Start of commercial production  
1992-05  
1
2014-03-01  

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