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HN1D03F(TE85L,F) PDF预览

HN1D03F(TE85L,F)

更新时间: 2024-09-13 14:51:07
品牌 Logo 应用领域
东芝 - TOSHIBA 测试二极管
页数 文件大小 规格书
4页 268K
描述
COMMON CATHODE AND COMMON ANODE ARRAY,TSOP

HN1D03F(TE85L,F) 技术参数

是否Rohs认证: 符合生命周期:Active
Reach Compliance Code:unknownECCN代码:EAR99
风险等级:5.75二极管类型:RECTIFIER DIODE
最大正向电压 (VF):1.2 V最高工作温度:125 °C
最低工作温度:-55 °C最大功率耗散:0.3 W
最大重复峰值反向电压:85 V最大反向电流:0.5 µA
最大反向恢复时间:0.004 µs反向测试电压:80 V
子类别:Rectifier Diodes表面贴装:YES
Base Number Matches:1

HN1D03F(TE85L,F) 数据手册

 浏览型号HN1D03F(TE85L,F)的Datasheet PDF文件第2页浏览型号HN1D03F(TE85L,F)的Datasheet PDF文件第3页浏览型号HN1D03F(TE85L,F)的Datasheet PDF文件第4页 
HN1D03F  
TOSHIBA Diode Silicon Epitaxial Planar Type  
HN1D03F  
Ultra High Speed Switching Application  
Unit: mm  
z Built in anode common and cathode common.  
Unit 1  
z Low forward voltage  
Q1, Q2: VF (3) = 0.90V (typ.)  
z Fast reverse recovery time Q1, Q2: trr = 1.6ns (typ.)  
z Small total capacitance  
Q1, Q2: CT = 0.9pF (typ.)  
Unit 2  
z Low forward voltage  
Q3, Q4: VF (3) = 0.92V (typ.)  
z Fast reverse recovery time Q3, Q4: trr = 1.6ns (typ.)  
z Small total capacitance Q3, Q4: CT = 2.2pF (typ.)  
Unit 1, Unit 2 Common Absolute Maximum Ratings  
(Ta = 25°C)  
Characteristic  
Symbol  
Rating  
Unit  
Maximum (peak) reverse voltage  
Reverse voltage  
V
85  
80  
V
V
RM  
JEDEC  
V
R
JEITA  
SC-74  
Maximum (peak) forward current  
Average forward current  
Surge current (10ms)  
I
300 (*)  
100 (*)  
2 (*)  
mA  
mA  
A
FM  
TOSHIBA  
Weight: 15 mg (typ.)  
I
O
I
FSM  
P
Power dissipation  
300  
mW  
°C  
°C  
Junction temperature  
T
j
125  
Storage temperature range  
T
55~125  
stg  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
(*) This is the Absolute Maximum Ratings of single diode (Q1 or Q2 or Q3 or Q4).  
In the case of using Unit 1 and Unit 2 independently or simultaneously, the Absolute Maximum Ratings  
per diode is 75% of the single diode one.  
Marking  
Pin Assignment (Top View)  
1
2007-11-01  

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