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FQI16N25CTU PDF预览

FQI16N25CTU

更新时间: 2024-11-04 03:37:39
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD 晶体晶体管功率场效应晶体管开关脉冲
页数 文件大小 规格书
9页 762K
描述
250V N-Channel MOSFET

FQI16N25CTU 技术参数

是否Rohs认证: 符合生命周期:Obsolete
包装说明:IN-LINE, R-PSIP-T3针数:3
Reach Compliance Code:compliantECCN代码:EAR99
风险等级:5.34雪崩能效等级(Eas):410 mJ
配置:SINGLE WITH BUILT-IN DIODE最小漏源击穿电压:250 V
最大漏极电流 (Abs) (ID):15.6 A最大漏极电流 (ID):15.6 A
最大漏源导通电阻:0.27 ΩFET 技术:METAL-OXIDE SEMICONDUCTOR
JESD-30 代码:R-PSIP-T3JESD-609代码:e3
元件数量:1端子数量:3
工作模式:ENHANCEMENT MODE最高工作温度:150 °C
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:IN-LINE峰值回流温度(摄氏度):NOT APPLICABLE
极性/信道类型:N-CHANNEL最大功率耗散 (Abs):139 W
最大脉冲漏极电流 (IDM):62.4 A认证状态:Not Qualified
子类别:FET General Purpose Power表面贴装:NO
端子面层:Matte Tin (Sn)端子形式:THROUGH-HOLE
端子位置:SINGLE处于峰值回流温度下的最长时间:NOT APPLICABLE
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

FQI16N25CTU 数据手册

 浏览型号FQI16N25CTU的Datasheet PDF文件第2页浏览型号FQI16N25CTU的Datasheet PDF文件第3页浏览型号FQI16N25CTU的Datasheet PDF文件第4页浏览型号FQI16N25CTU的Datasheet PDF文件第5页浏览型号FQI16N25CTU的Datasheet PDF文件第6页浏览型号FQI16N25CTU的Datasheet PDF文件第7页 
June 2006  
®
QFET  
FQB16N25C/FQI16N25C  
250V N-Channel MOSFET  
Features  
Description  
15.6A, 250V, RDS(on)  
=
0.27 @VGS = 10 V  
These N-Channel enhancement mode power field effect  
transistors are produced using Fairchild’s proprietary, planar  
stripe, DMOS technology.  
This advanced technology has been especially tailored to  
minimize on-state resistance, provide superior switching  
performance, and withstand high energy pulse in the avalanche  
and commutation mode. These devices are well suited for high  
efficiency switching DC/DC converters, switch mode power  
supplies, DC-AC converters for uninterrupted power supplies  
and motor controls.  
Low gate charge ( typical 41nC)  
Low Crss ( typical 68pF)  
Fast switching  
100% avalanche tested  
Improved dv/dt capability  
D
D
G
I2-PAK  
FQI Series  
S
D2-PAK  
FQB Series  
G
S
G D S  
Absolute Maximum Ratings  
Symbol  
Parameter  
FQB16N25C / FQI16N25C  
Units  
V
VDSS  
Drain-Source Voltage  
250  
15.6  
ID  
Drain Current  
- Continuous (TC = 25°C)  
- Continuous (TC = 100°C)  
- Pulsed  
A
9.8  
A
(Note 1)  
IDM  
Drain Current  
62.4  
A
VGSS  
EAS  
IAR  
Gate-Source Voltage  
± 30  
V
(Note 2)  
(Note 1)  
(Note 1)  
(Note 3)  
Single Pulsed Avalanche Energy  
Avalanche Current  
410  
mJ  
A
15.6  
EAR  
dv/dt  
PD  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
Power Dissipation (TA = 25°C)*  
Power Dissipation (TC = 25°C)  
13.9  
mJ  
V/ns  
W
5.5  
3.13  
139  
W
- Derate above 25°C  
1.11  
W/°C  
°C  
TJ, TSTG  
TL  
Operating and Storage Temperature Range  
-55 to +150  
Maximum lead temperature for soldering purposes,  
1/8" from case for 5 seconds  
300  
°C  
Thermal Characteristics  
Symbol  
Parameter  
FQB16N25C / FQI16N25C Units  
RθJC  
RθJA  
RθJA  
Thermal Resistance, Junction-to-Case  
Thermal Resistance, Junction-to-Ambient*  
Thermal Resistance, Junction-to-Ambient  
0.9  
40  
°C/W  
°C/W  
°C/W  
62.5  
* When mounted on the minimum pad size recommended (PCB Mount)  
©2006 Fairchild Semiconductor Corporation  
FQB16N25C/FQI16N25C Rev. A1  
1
www.fairchildsemi.com  

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