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FDT457NJ23Z PDF预览

FDT457NJ23Z

更新时间: 2024-10-29 23:51:55
品牌 Logo 应用领域
其他 - ETC 晶体晶体管开关脉冲光电二极管
页数 文件大小 规格书
5页 86K
描述
TRANSISTOR | MOSFET | N-CHANNEL | 30V V(BR)DSS | 5A I(D) | SOT-223

FDT457NJ23Z 数据手册

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August 1998  
FDT457N  
N-Channel Enhancement Mode Field Effect Transistor  
General Description  
Features  
These N-Channel enhancement mode power field effect  
transistors are produced using Fairchild's proprietary, high  
cell density, DMOS technology. This very high density  
process is especially tailored to minimize on-state resistance,  
provide superior switching performance. These products are  
well suited to low voltage, low current applications such as  
notebook computer power management, battery powered  
circuits, and DC motor control.  
5 A, 30 V. RDS(ON) = 0.06 W @ VGS = 10 V  
RDS(ON) = 0.090 W @ VGS = 4.5 V.  
High density cell design for extremely low RDS(ON)  
.
High power and current handling capability in a widely used  
surface mount package.  
SuperSOTTM-3  
SuperSOTTM-8  
SO-8  
SuperSOTTM-6  
SOIC-16  
SOT-223  
D
D
D
D
S
S
D
D
S
G
G
S
G
*
SOT-223  
G
SOT-223  
(J23Z)  
Absolute Maximum Ratings TA = 25oC unless otherwise noted  
Symbol Parameter  
FDT457N  
Units  
Drain-Source Voltage  
30  
V
VDSS  
VGSS  
ID  
Gate-Source Voltage - Continuous  
Maximum Drain Current - Continuous  
- Pulsed  
±20  
V
A
(Note 1a)  
(Note 1a)  
5
16  
3
Maximum Power Dissipation  
W
PD  
(Note 1b)  
(Note 1c)  
1.3  
1.1  
Operating and Storage Temperature Range  
-65 to 150  
°C  
TJ,TSTG  
THERMAL CHARACTERISTICS  
RqJA  
RqJC  
Thermal Resistance, Junction-to-Ambient (Note 1a)  
Thermal Resistance, Junction-to-Case  
42  
12  
°C/W  
°C/W  
(Note 1)  
* Order option J23Z for cropped center drain lead.  
FDT457N Rev.C  
© 1998 Fairchild Semiconductor Corporation  

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