CDC536
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS378F – APRIL 1994 – REVISED OCTOBER 1998
DB OR DL PACKAGE
(TOP VIEW)
Low-Output Skew for Clock-Distribution
and Clock-Generation Applications
Operates at 3.3-V V
CC
AV
AV
CC
1
2
3
4
5
6
7
8
9
28
27
26
25
24
23
22
21
20
CC
Distributes One Clock Input to Six Outputs
AGND
CLKIN
SEL
OE
GND
1Y1
AGND
FBIN
TEST
CLR
One Select Input Configures Three Outputs
to Operate at One-Half or Double the Input
Frequency
No External RC Network Required
V
CC
2Y1
GND
External Feedback Pin (FBIN) Is Used to
Synchronize the Outputs to the Clock Input
V
GND
CC
V
CC
Application for Synchronous DRAM,
High-Speed Microprocessor
1Y2 10
V
19 2Y2
GND
11
12
18
17
CC
Negative-Edge-Triggered Clear for
Half-Frequency Outputs
GND
V
CC
16 2Y3
1Y3 13
14
TTL-Compatible Inputs and Outputs
15 GND
V
CC
Outputs Drive 50-Ω Parallel-Terminated
Transmission Lines
State-of-the-Art EPIC-ΙΙB BiCMOS Design
Significantly Reduces Power Dissipation
Distributed V
Switching Noise
and Ground Pins Reduce
CC
Packaged in Plastic 28-Pin Shrink Small
Outline Package
description
TheCDC536isahigh-performance, low-skew, low-jitterclockdriver. Itusesaphase-lockloop(PLL)toprecisely
align, in both frequency and phase, the clock output signals to the clock input (CLKIN) signal. It is specifically
designed for use with synchronous DRAMs and popular microprocessors operating at speeds from 50 MHz to
100 MHz or down to 25 MHz on outputs configured as half-frequency outputs. The CDC536 operates at 3.3-V
V
and is designed to drive a 50- transmission line.
CC
The feedback input (FBIN) is used to synchronize the output clocks in frequency and phase to the input clock
(CLKIN). One of the six output clocks must be fed back to FBIN for the PLL to maintain synchronization between
CLKIN and the outputs. The output used as the feedback pin is synchronized to the same frequency as CLKIN.
The Y outputs can be configured to switch in phase and at the same frequency as CLKIN. The select (SEL)
input configures three Y outputs to operate at one-half or double the CLKIN frequency depending on which pin
is fed back to FBIN (see Tables 1 and 2). All output signal duty cycles are adjusted to 50% independent of the
duty cycle at the input clock.
Output-enable(OE)isprovidedforoutputcontrol. WhenOEishigh, theoutputsareinthehigh-impedancestate.
When OE is low, the outputs are active. TEST is used for factory testing of the device and can be use to bypass
the PLL. TEST should be strapped to GND for normal operation.
Unlike many products containing PLLs, the CDC536 does not require external RC networks. The loop filter for
the PLL is included on-chip, minimizing component count, board space, and cost.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC-ΙΙB is a trademark of Texas Instruments Incorporated.
Copyright 1998, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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