TPCP8012
4. Absolute Maximum Ratings (Note) (Ta = 25 unless otherwise specified)
Characteristics
Symbol
Rating
Unit
V
Drain-source voltage
Gate-source voltage
Drain current (DC)
Drain current (pulsed)
Power dissipation
VDSS
VGSS
ID
60
±20
(Note 1)
(Note 1)
(Note 2)
(Note 3)
(Note 4)
8
32
A
IDP
(t = 5 s)
(t = 5 s)
PD
2.01
1
W
W
mJ
A
Power dissipation
PD
Single-pulse avalanche energy
Avalanche current
EAS
IAR
72.1
8
Channel temperature
Storage temperature
(Note 5)
(Note 5)
Tch
Tstg
175
-55 to 175
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
5. Thermal Characteristics
Characteristics
Symbol
Max
Unit
Channel-to-ambient thermal resistance
Channel-to-ambient thermal resistance
(t = 5 s)
(t = 5 s)
(Note 2)
(Note 3)
Rth(ch-a)
Rth(ch-a)
74.6
150
/W
/W
Note 1: Ensure that the channel temperature does not exceed 175.
Note 2: Device mounted on a glass-epoxy board (a), Figure 5.1
Note 3: Device mounted on a glass-epoxy board (b), Figure 5.2
Note 4: VDD = 25 V, Tch = 25 (initial), L = 1.531 mH, RG = 1 Ω, IAR = 8 A
Note 5: The definitions of the absolute maximum channel and storage temperatures are qualified per AEC-Q101.
Fig. 5.1 Device Mounted on a Glass-Epoxy
Board (a)
Fig. 5.2 Device Mounted on a Glass-Epoxy
Board (b)
Note: This transistor is sensitive to electrostatic discharge and should be handled with care.
©2016 Toshiba Corporation
2016-02-23
Rev.6.0
2