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RN2713JE PDF预览

RN2713JE

更新时间: 2024-11-04 11:58:59
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体开关小信号双极晶体管光电二极管驱动
页数 文件大小 规格书
6页 261K
描述
Switching, Inverter Circuit, Interface Circuit and Driver Circuit Applications

RN2713JE 技术参数

是否Rohs认证: 符合生命周期:Active
包装说明:SMALL OUTLINE, R-PDSO-F5针数:5
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8541.21.00.75风险等级:5.55
其他特性:BUILT-IN BIAS RESISTOR最大集电极电流 (IC):0.1 A
集电极-发射极最大电压:50 V配置:COMMON EMITTER, 2 ELEMENTS WITH BUILT-IN RESISTOR
最小直流电流增益 (hFE):120JESD-30 代码:R-PDSO-F5
元件数量:2端子数量:5
最高工作温度:150 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
峰值回流温度(摄氏度):NOT SPECIFIED极性/信道类型:PNP
最大功率耗散 (Abs):0.1 W认证状态:Not Qualified
子类别:BIP General Purpose Small Signal表面贴装:YES
端子形式:FLAT端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED晶体管应用:SWITCHING
晶体管元件材料:SILICON标称过渡频率 (fT):200 MHz
Base Number Matches:1

RN2713JE 数据手册

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RN2712JE,RN2713JE  
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process)  
RN2712JE, RN2713JE  
Switching, Inverter Circuit, Interface Circuit and  
Driver Circuit Applications  
Unit : mm  
z Two devices are incorporated into an Extreme-Super-Mini (5 pin)  
package.  
z Incorporating a bias resistor into a transistor reduces parts count.  
Reducing the parts count enables the manufacture of ever more compact  
equipment and lowers assembly cost.  
z A wide range of resistor values is available for use in various circuits.  
Equivalent Circuit  
1.BASE1  
(B1)  
2.EMITTER  
3.BASE2  
4.COLLECTOR2  
5.COLLECTOR1  
(E)  
(B2)  
(C2)  
(C1)  
JEDEC  
Absolute Maximum Ratings (Ta = 25°C)  
JEITA  
TOSHIBA  
2-2P1D  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
Weight: 0.003g(typ.)  
V
CBO  
V
CEO  
V
EBO  
50  
50  
V
V
Collector-emitter voltage  
Emitter-base voltage  
5  
V
Collector current  
I
100  
100  
mA  
mW  
°C  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P *  
C
T
150  
j
T
stg  
55~150  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
*: Total rating  
Equivalent Circuit  
(top view)  
5
4
Q1  
Q2  
1
2
3
1
2007-11-01  

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