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RN2902(TE85L,F) PDF预览

RN2902(TE85L,F)

更新时间: 2024-11-04 20:39:39
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体管
页数 文件大小 规格书
7页 575K
描述
PRE-BIASED "DIGITAL" TRANSISTOR,50V V(BR)CEO,100MA I(C),TSOP

RN2902(TE85L,F) 技术参数

是否Rohs认证: 符合生命周期:Active
包装说明:,Reach Compliance Code:unknown
风险等级:5.78最大集电极电流 (IC):0.1 A
最小直流电流增益 (hFE):50元件数量:2
极性/信道类型:PNP最大功率耗散 (Abs):0.2 W
子类别:BIP General Purpose Small Signal表面贴装:YES
晶体管元件材料:SILICONBase Number Matches:1

RN2902(TE85L,F) 数据手册

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RN2901~RN2906  
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process) (Bias Resistor Built-in Transistor)  
RN2901,RN2902,RN2903,RN2904,RN2905,RN2906  
Switching, Inverter Circuit, Interface Circuit  
and Driver Circuit Applications  
Unit : mm  
z Including two devices in US6 (ultra super mini type with 6 leads)  
z With built-in bias resistors  
z Simplify circuit design  
z Reduce a quantity of parts and manufacturing process  
z Complementary to RN1901 to RN1906  
Equivalent Circuit and Bias Resistor Values  
Type No.  
R1 (k)  
R2 (k)  
RN2901  
RN2902  
RN2903  
RN2904  
RN2905  
RN2906  
4.7  
10  
4.7  
10  
22  
47  
47  
47  
22  
US6  
47  
JEDEC  
2.2  
4.7  
JEITA  
2-2J1A  
TOSHIBA  
Weight: 6.8 mg (typ.)  
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 Common)  
Equivalent Circuit  
(Top View)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
V
50  
50  
V
V
CBO  
CEO  
RN2901 to 2906  
Collector-emitter voltage  
RN2901 to 2904  
RN2905, 2906  
10  
Emitter-base voltage  
V
V
EBO  
5  
Collector current  
I
100  
200  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P *  
C
RN2901 to 2906  
T
150  
j
T
stg  
55~150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
* : Total rating  
1
2010-07-09  

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