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RN2707JE(TE85L) PDF预览

RN2707JE(TE85L)

更新时间: 2024-11-05 10:43:31
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
6页 334K
描述
RN2707JE(TE85L)

RN2707JE(TE85L) 数据手册

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RN2707JE~RN2709JE  
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process) (Bias Resistor Built-in Transistor)  
RN2707JE,RN2708JE,RN2709JE  
Switching, Inverter Circuit, Interface Circuit and  
Unit: mm  
Driver Circuit Applications  
Two devices are incorporated into an Extreme-Super-Mini (5 pin) package.  
Incorporating a bias resistor into a transistor reduces parts count.  
Reducing the parts count enables the manufacture of ever more compact  
equipment and lowers assembly cost.  
A wide range of resistor values are available for use in various circuit  
designs.  
Complementary to RN1707JE to RN1709JE  
Equivalent Circuit and Bias Resistor Values  
1.BASE1  
2.EMITTER  
3.BASE2  
4.COLLECTOR2  
5.COLLECTOR1  
(B1)  
(E)  
(B2)  
(C2)  
(C1)  
C
Type No.  
R1 (kΩ)  
R2 (kΩ)  
RN2707JE  
RN2708JE  
RN2709JE  
10  
22  
47  
47  
47  
22  
R1  
B
JEDEC  
JEITA  
E
TOSHIBA  
2-2P1D  
Weight: 3 mg (typ.)  
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 common)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
Equivalent Circuit  
(top view)  
V
V
50  
50  
V
V
CBO  
CEO  
RN2707JE  
to 2709JE  
Collector-emitter voltage  
5
4
RN2707JE  
RN2708JE  
RN2709JE  
6  
Q1  
Q2  
Emitter-base voltage  
V
C
V
7  
EBO  
15  
Collector current  
I
100  
100  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
(Note 1)  
1
2
3
RN2707JE  
to 2709JE  
T
150  
j
T
55~150  
°C  
stg  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1: Total rating  
1
2010-05-14  

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