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RN1101F_07 PDF预览

RN1101F_07

更新时间: 2024-11-21 04:07:47
品牌 Logo 应用领域
东芝 - TOSHIBA 开关驱动
页数 文件大小 规格书
8页 573K
描述
Switching, Inverter Circuit, Interface Circuit And Driver Circuit Applications

RN1101F_07 数据手册

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RN1101FRN1106F  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process)  
RN1101F,RN1102F,RN1103F  
RN1104F,RN1105F,RN1106F  
Switching, Inverter Circuit, Interface Circuit  
And Driver Circuit Applications  
Unit in mm  
z With built-in bias resistors  
z Simplify circuit design  
z Reduce a quantity of parts and manufacturing process  
z Complementary to RN2101F~RN2106F  
Equivalent Circuit And Bias Resister Values  
Type No.  
R1 (k)  
R2 (k)  
RN1101F  
RN1102F  
RN1103F  
RN1104F  
RN1105F  
RN1106F  
4.7  
10  
4.7  
10  
22  
47  
47  
47  
22  
47  
2.2  
4.7  
JEDEC  
EIAJ  
2-2H1A  
TOSHIBA  
Weight: 2.3 mg  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
V
50  
50  
V
V
CBO  
CEO  
RN1101F~1106F  
Collector-emitter voltage  
RN1101F~1104F  
RN1105F, 1106F  
10  
Emitter-base voltage  
V
V
EBO  
5
Collector current  
I
100  
100  
150  
55~150  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
C
RN1101F~1106F  
T
j
T
stg  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2007-11-01  

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