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RN1102CT PDF预览

RN1102CT

更新时间: 2024-11-01 12:23:03
品牌 Logo 应用领域
东芝 - TOSHIBA 驱动器开关
页数 文件大小 规格书
8页 173K
描述
Switching Applications Inverter Circuit Applications Interface Circuit Applications Driver Circuit Applications

RN1102CT 技术参数

生命周期:Lifetime Buy包装说明:CHIP CARRIER, R-XBCC-N3
针数:3Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8541.21.00.95
风险等级:5.7其他特性:BUILT-IN BIAS RESISTOR RATIO IS 1
外壳连接:COLLECTOR最大集电极电流 (IC):0.05 A
集电极-发射极最大电压:20 V配置:SINGLE WITH BUILT-IN RESISTOR
最小直流电流增益 (hFE):60JESD-30 代码:R-XBCC-N3
元件数量:1端子数量:3
封装主体材料:UNSPECIFIED封装形状:RECTANGULAR
封装形式:CHIP CARRIER极性/信道类型:NPN
认证状态:Not Qualified表面贴装:YES
端子形式:NO LEAD端子位置:BOTTOM
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

RN1102CT 数据手册

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RN1101CT ~ RN1106CT  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT process) (Bias Resistor built-in Transistor)  
RN1101CT,RN1102CT,RN1103CT  
RN1104CT,RN1105CT,RN1106CT  
Switching Applications  
Unit: mm  
0.6±0.05  
Inverter Circuit Applications  
0.5±0.03  
Interface Circuit Applications  
Driver Circuit Applications  
Incorporating a bias resistor into a transistor reduces parts count.  
Reducing the parts count enable the manufacture of ever more  
compact equipment and save assembly cost.  
Complementary to RN2101CT to RN2106CT  
0.05±0.03  
0.35±0.02  
0.15±0.03  
Equivalent Circuit and Bias Resistor Values  
C
Type No.  
R1 (kΩ)  
R2 (kΩ)  
1.BASE  
RN1101CT  
RN1102CT  
RN1103CT  
RN1104CT  
RN1105CT  
RN1106CT  
4.7  
10  
4.7  
10  
22  
47  
47  
47  
2. EMITTER  
R1  
CST3  
B
3, COLLECTOR  
22  
JEDEC  
JEITA  
47  
E
2.2  
4.7  
TOSHIBA  
2-1J1A  
Weight: 0.75 mg (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Symbol  
Rating  
Unit  
Collector-base voltage  
V
V
20  
V
V
CBO  
CEO  
RN1101CT to 1106CT  
Collector-emitter voltage  
Emitter-base voltage  
20  
RN1101CT to 1104CT  
RN1105CT, 1106CT  
10  
V
V
EBO  
5
50  
Collector current  
I
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
50  
C
RN1101CT ro 1106CT  
T
j
150  
T
55 to 150  
°C  
stg  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if  
the operating conditions (i.e.operatingtemperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2009-04-13  

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