NTMKE4894N
Power MOSFET
25 V, 160 A, Single N−Channel, ICEPAK
Features
• Low Package Inductance
• Low R
to Minimize Conduction Losses
DS(on)
• Low Capacitance to Minimize Driver Losses
• Optimized Gate Charge to Minimize Switching Losses
• Dual Sided Cooling Capability
http://onsemi.com
V
R
MAX
I MAX
D
(BR)DSS
DS(ON)
• Compatible with MX Footprint and Outline
• This is a Pb−Free Device
1.7 mW @ 10 V
2.4 mW @ 4.5 V
25 V
160 A
Applications
• CPU Power Delivery
• DC−DC Converters
• Optimized for Control FET
MARKING
DIAGRAM
ICEPAK
E PAD
CASE 145AB
E4894
AYWWG
G
MAXIMUM RATINGS (T = 25°C unless otherwise stated)
J
Parameter
Drain−to−Source Voltage
Symbol Value Unit
V
DSS
25
20
V
V
A
Gate−to−Source Voltage
V
GS
E4894= Specific Device Code
Continuous Drain
I
D
T = 25°C
33
A
A
Y
= Assembly Location
= Year
Current R
(Note 1)
q
JA
T = 70°C
A
26.4
2.8
WW = Work Week
Power Dissipation R
(Note 1)
T = 25°C
A
P
D
W
A
q
JA
G
= Pb−Free Package
(Note: Microdot may be in either location)
Continuous Drain
Current R
I
D
T = 25°C
160
88.6
65
A
q
J−PCB
T = 70°C
A
Steady
State
(Note 2)
D
Power Dissipation
T = 25°C
A
P
I
W
A
D
R
(Note 2)
q
J−PCB
Continuous Drain
Current R (Note 1)
T
C
T
C
T
C
= 25°C
= 70°C
= 25°C
170
136
73.5
D
q
JC
G
Power Dissipation
(Note 1)
P
D
W
R
q
JC
Pulsed Drain Current
T = 25°C, t = 10 ms
I
DM
250
50
A
A
A
p
S
Current Limited by Package
T = 25°C
A
I
Dmax
N−CHANNEL MOSFET
Operating Junction and Storage Temperature
T ,
−40 to
150
°C
J
stg
T
ORDERING INFORMATION
Source Current (Body Diode) (Note 1)
Drain to Source DV/DT
I
92
6.0
577
A
S
†
Device
Package
Shipping
dV/dt
V/ns
mJ
Single Pulse Drain−to−Source Avalanche Energy
E
AS
NTMKE4894NT1G ICEPAK 1500/Tape & Reel
(T = 25°C, V = 25 V, V = 10 V,
J
DD
GS
(Pb−Free)
I = 62 A , L = 0.3 mH, R = 25 W)
L
pk
G
NTMKE4894NT3G ICEPAK 5000/Tape & Reel
Lead Temperature for Soldering Purposes
(1/8″ from case for 10 s)
T
270
°C
L
(Pb−Free)
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
1. Surfacemounted on FR4 board using 1 sq−in pad, 1 oz Cu.
2. Measured with a T of approximately 90°C using 1 oz Cu board.
J
3. Surfacemounted on FR4 board using 1 sq−in pad, 2 oz Cu.
© Semiconductor Components Industries, LLC, 2011
1
Publication Order Number:
January, 2011 − Rev. 3
NTMKE4894N/D