NTMS10P02R2
Power MOSFET
−10 Amps, −20 Volts
P−Channel Enhancement−Mode
Single SOIC−8 Package
Features
http://onsemi.com
• Ultra Low R
DS(on)
• Higher Efficiency Extending Battery Life
• Logic Level Gate Drive
−10 AMPERES
−20 VOLTS
14 mW @ VGS = −4.5 V
• Miniature SOIC−8 Surface Mount Package
• Diode Exhibits High Speed, Soft Recovery
• Avalanche Energy Specified
P−Channel
D
• SOIC−8 Mounting Information Provided
• Pb−Free Package is Available
Applications
G
• Power Management in Portable and Battery−Powered Products,
i.e.: Cellular and Cordless Telephones and PCMCIA Cards
S
MAXIMUM RATINGS
Rating
Symbol
Value
−20
Unit
Vdc
Vdc
MARKING DIAGRAM &
PIN ASSIGNMENT
Drain−to−Source Voltage
V
DSS
Gate−to−Source Voltage − Continuous
V
GS
"12
D
D
D
D
8
8
Thermal Resistance −
Junction−to−Ambient (Note 1)
R
50
2.5
−10
−8.0
0.6
−5.5
−50
°C/W
W
A
1
q
P
D
D
D
D
D
JA
E10P02
AYWW G
G
Total Power Dissipation @ T = 25°C
A
SOIC−8
CASE 751
STYLE 12
Continuous Drain Current @ 25°C
Continuous Drain Current @ 70°C
Maximum Operating Power Dissipation
Maximum Operating Drain Current
Pulsed Drain Current (Note 3)
I
I
P
A
W
A
1
I
S
S
S
G
I
A
DM
Thermal Resistance −
E10P02 = Specific Device Code
Junction−to−Ambient (Note 2)
R
80
°C/W
W
A
q
JA
A
Y
= Assembly Location
= Year
Total Power Dissipation @ T = 25°C
P
D
1.6
A
Continuous Drain Current @ 25°C
Continuous Drain Current @ 70°C
Maximum Operating Power Dissipation
Maximum Operating Drain Current
Pulsed Drain Current (Note 3)
I
I
P
−8.8
−6.4
0.4
−4.5
−44
D
D
D
D
WW
G
= Work Week
= Pb−Free Package
A
W
A
A
I
(Note: Microdot may be in either location)
I
DM
Operating and Storage Temperature Range
T , T
−55 to
+150
°C
J
stg
ORDERING INFORMATION
†
Single Pulse Drain−to−Source Avalanche En-
E
500
mJ
Device
Package
Shipping
AS
ergy − Starting T = 25°C
J
(V = −20 Vdc, V = −4.5 Vdc,
NTMS10P02R2
NTMS10P02R2G
SOIC−8
2500/Tape & Reel
2500/Tape & Reel
DD
GS
Peak I = 5.0 Apk, L = 40 mH, R = 25 W)
L
G
SOIC−8
(Pb−Free)
Maximum Lead Temperature for Soldering
Purposes, 1/8″ from case for 10 seconds
T
260
°C
L
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
1. Mounted onto a 2″ square FR−4 Board
(1 in sq, Cu 0.06″ thick single sided), t = 10 seconds.
2. Mounted onto a 2″ square FR−4 Board
(1 in sq, Cu 0.06″ thick single sided), t = steady state.
3. Pulse Test: Pulse Width < 300 ms, Duty Cycle < 2%.
© Semiconductor Components Industries, LLC, 2006
1
Publication Order Number:
March, 2006 − Rev. 3
NTMS10P02R2/D