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NE3512S02-T1C PDF预览

NE3512S02-T1C

更新时间: 2024-01-08 20:25:06
品牌 Logo 应用领域
CEL 晶体晶体管场效应晶体管
页数 文件大小 规格书
8页 266K
描述
HETERO JUNCTION FIELD EFFECT TRANSISTOR

NE3512S02-T1C 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Obsolete包装说明:LEAD FREE, PLASTIC, MICRO-X-4
针数:4Reach Compliance Code:compliant
ECCN代码:EAR99Factory Lead Time:1 week
风险等级:5.3Is Samacsys:N
其他特性:LOW NOISE配置:SINGLE
最小漏源击穿电压:3 V最大漏极电流 (ID):0.015 A
FET 技术:HETERO-JUNCTION最高频带:KU BAND
JESD-30 代码:R-PQMW-F4JESD-609代码:e6
元件数量:1端子数量:4
工作模式:DEPLETION MODE最高工作温度:125 °C
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:MICROWAVE峰值回流温度(摄氏度):NOT SPECIFIED
极性/信道类型:N-CHANNEL最大功率耗散 (Abs):0.165 W
最小功率增益 (Gp):12.5 dB认证状态:Not Qualified
子类别:Other Transistors表面贴装:YES
端子面层:Tin/Bismuth (Sn/Bi)端子形式:FLAT
端子位置:QUAD处于峰值回流温度下的最长时间:NOT SPECIFIED
晶体管应用:AMPLIFIER晶体管元件材料:SILICON
Base Number Matches:1

NE3512S02-T1C 数据手册

 浏览型号NE3512S02-T1C的Datasheet PDF文件第2页浏览型号NE3512S02-T1C的Datasheet PDF文件第3页浏览型号NE3512S02-T1C的Datasheet PDF文件第4页浏览型号NE3512S02-T1C的Datasheet PDF文件第6页浏览型号NE3512S02-T1C的Datasheet PDF文件第7页浏览型号NE3512S02-T1C的Datasheet PDF文件第8页 
NE3512S02  
RF MEASURING LAYOUT PATTERN (REFERENCE ONLY) (UNIT: mm)  
2.80  
2.60  
2.06  
0.64  
1.7 mm/R.P.  
2.6  
1.7  
1.7  
Reference Plane  
Reference Plane  
(Calibration Plane)  
(Calibration Plane)  
φ
0.3 TH  
L2–uX Ver. 1  
6.0  
RT/duroid 5880/ROGERS  
t = 0.254 mm  
εr = 2.20  
tan delta = 0.0009 @10 GHz  
5
Data Sheet PG10592EJ01V0DS  

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