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NE3511S02-T1C-A PDF预览

NE3511S02-T1C-A

更新时间: 2024-01-14 11:29:28
品牌 Logo 应用领域
CEL 晶体放大器晶体管ISM频段
页数 文件大小 规格书
10页 284K
描述
X TO Ku BAND SUPER LOW NOISE AMPLIFIER N-CHANNEL HJ-FET

NE3511S02-T1C-A 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Obsolete包装说明:MICROWAVE, R-PQMW-F4
针数:4Reach Compliance Code:compliant
ECCN代码:EAR99风险等级:5.19
Is Samacsys:N配置:SINGLE
最小漏源击穿电压:3 V最大漏极电流 (ID):0.02 A
FET 技术:HETERO-JUNCTION最高频带:KU BAND
JESD-30 代码:R-PQMW-F4JESD-609代码:e6
元件数量:1端子数量:4
工作模式:DEPLETION MODE最高工作温度:125 °C
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:MICROWAVE峰值回流温度(摄氏度):NOT SPECIFIED
极性/信道类型:N-CHANNEL最大功率耗散 (Abs):0.165 W
最小功率增益 (Gp):12.5 dB认证状态:Not Qualified
子类别:Other Transistors表面贴装:YES
端子面层:TIN BISMUTH端子形式:FLAT
端子位置:QUAD处于峰值回流温度下的最长时间:NOT SPECIFIED
晶体管应用:AMPLIFIER晶体管元件材料:SILICON
Base Number Matches:1

NE3511S02-T1C-A 数据手册

 浏览型号NE3511S02-T1C-A的Datasheet PDF文件第1页浏览型号NE3511S02-T1C-A的Datasheet PDF文件第3页浏览型号NE3511S02-T1C-A的Datasheet PDF文件第4页浏览型号NE3511S02-T1C-A的Datasheet PDF文件第5页浏览型号NE3511S02-T1C-A的Datasheet PDF文件第6页浏览型号NE3511S02-T1C-A的Datasheet PDF文件第7页 
NE3511S02  
RECOMMENDED OPERATING CONDITIONS (TA = +25°C)  
Parameter  
Drain to Source Voltage  
Drain Current  
Symbol  
VDS  
ID  
MIN.  
TYP.  
2
MAX.  
Unit  
V
1
5
3
20  
0
10  
mA  
dBm  
Input Power  
Pin  
ELECTRICAL CHARACTERISTICS (TA = +25°C, unless otherwise specified)  
Parameter  
Gate to Source Leak Current  
Saturated Drain Current  
Gate to Source Cutoff Voltage  
Transconductance  
Symbol  
IGSO  
Test Conditions  
MIN.  
TYP.  
0.5  
MAX.  
Unit  
µA  
mA  
V
VGS = 3 V  
10  
70  
IDSS  
VDS = 2 V, VGS = 0 V  
20  
40  
VGS (off)  
gm  
VDS = 2 V, ID = 100 µA  
0.2  
50  
0.7  
65  
1.7  
VDS = 2 V, ID = 10 mA  
mS  
dB  
dB  
Noise Figure  
NF  
VDS = 2 V, ID = 10 mA, f = 12 GHz  
0.30  
13.5  
0.45  
Associated Gain  
Ga  
12.5  
2
Data Sheet PG10642EJ01V0DS  

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