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MRFG35003M6T1_06 PDF预览

MRFG35003M6T1_06

更新时间: 2024-11-05 05:50:11
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飞思卡尔 - FREESCALE 晶体晶体管功率场效应晶体管
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12页 132K
描述
Gallium Arsenide PHEMT RF Power Field Effect Transistor

MRFG35003M6T1_06 数据手册

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Document Number: MRFG35003M6T1  
Rev. 4, 1/2006  
Freescale Semiconductor  
Technical Data  
Replaced by MRFG35003N6T1. There are no form, fit or function changes with this  
part replacement. N suffix added to part number to indicate transition to lead-free  
terminations.  
MRFG35003M6T1  
Gallium Arsenide PHEMT  
RF Power Field Effect Transistor  
Designed for 3.5 GHz WLL/MMDS/BWA or UMTS applications. Character-  
ized from 0.5 to 5.0 GHz. Device is unmatched and is characterized for use in  
Class AB Customer Premise Equipment (CPE) applications.  
3.5 GHz, 3 W, 6 V  
POWER FET  
GaAs PHEMT  
Typical W-CDMA Performance: -42 dBc ACPR, 3.55 GHz, 6 Volts,  
IDQ = 180 mA  
Output Power — 450 mWatts  
Power Gain — 9 dB  
Efficiency — 24%  
3 Watts P1dB @ 3.55 GHz  
Excellent Phase Linearity and Group Delay Characteristics  
High Gain, High Efficiency and High Linearity  
In Tape and Reel. T1 Suffix = 1000 Units per 12 mm, 7 inch Reel.  
CASE 466-03, STYLE 1  
PLD-1.5  
PLASTIC  
Table 1. Maximum Ratings  
Rating  
Symbol  
Value  
Unit  
Drain-Source Voltage  
V
DSS  
8
Vdc  
(2)  
Total Device Dissipation @ T = 25°C  
P
22.7  
0.15  
W
W/°C  
C
D
(2)  
Derate above 25°C  
Gate-Source Voltage  
RF Input Power  
V
GS  
-5  
Vdc  
dBm  
°C  
P
in  
24  
Storage Temperature Range  
T
stg  
-65 to +150  
175  
(1)  
Channel Temperature  
T
ch  
°C  
Operating Case Temperature Range  
T
C
-20 to +85  
°C  
Table 2. Thermal Characteristics  
Characteristic  
Symbol  
Value  
Unit  
(2)  
Thermal Resistance, Junction to Case  
R
6.6  
°C/W  
θ
JC  
Table 3. Moisture Sensitivity Level  
Test Methodology  
Per JESD 22-A113, IPC/JEDEC J-STD-020  
Rating  
Package Peak Temperature  
Unit  
1
260  
°C  
1. For reliable operation, the operating channel temperature should not exceed 150°C.  
2. Simulated.  
© Freescale Semiconductor, Inc., 2006. All rights reserved.  

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