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MRF1513NT1 PDF预览

MRF1513NT1

更新时间: 2024-11-23 02:59:51
品牌 Logo 应用领域
飞思卡尔 - FREESCALE 晶体晶体管功率场效应晶体管射频放大器PC
页数 文件大小 规格书
16页 480K
描述
RF Power Field Effect Transistor N−Channel Enhancement−Mode Lateral MOSFET

MRF1513NT1 数据手册

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Document Number: MRF1513  
Rev. 7, 5/2006  
Freescale Semiconductor  
Technical Data  
Replaced by MRF1513NT1. There are no form, fit or function changes with this part  
replacement. N suffix added to part number to indicate transition to lead-free  
terminations.  
MRF1513T1  
RF Power Field Effect Transistor  
N-Channel Enhancement-Mode Lateral MOSFET  
Designed for broadband commercial and industrial applications with frequen-  
cies to 520 MHz. The high gain and broadband performance of this device  
make it ideal for large-signal, common source amplifier applications in 7.5 volt  
D
portable and 12.5 volt mobile FM equipment.  
520 MHz, 3 W, 12.5 V  
LATERAL N-CHANNEL  
BROADBAND  
Specified Performance @ 520 MHz, 12.5 Volts  
Output Power — 3 Watts  
Power Gain — 11 dB  
Efficiency — 55%  
RF POWER MOSFET  
Capable of Handling 20:1 VSWR, @ 15.5 Vdc,  
520 MHz, 2 dB Overdrive  
Excellent Thermal Stability  
G
Characterized with Series Equivalent Large-Signal  
Impedance Parameters  
Broadband UHF/VHF Demonstration Amplifier Information  
Available Upon Request  
S
CASE 466-03, STYLE 1  
PLD-1.5  
In Tape and Reel. T1 Suffix = 1,000 Units per 12 mm,  
7 Inch Reel.  
PLASTIC  
Table 1. Maximum Ratings  
Rating  
Symbol  
Value  
-0.5, +40  
20  
Unit  
Vdc  
Vdc  
Adc  
Drain-Source Voltage  
Gate-Source Voltage  
V
DSS  
V
GS  
Drain Current — Continuous  
I
2
D
(1)  
Total Device Dissipation @ T = 25°C  
Derate above 25°C  
P
31.25  
0.25  
W
W/°C  
C
D
Storage Temperature Range  
Operating Junction Temperature  
Table 2. Thermal Characteristics  
T
- 65 to +150  
150  
°C  
°C  
stg  
T
J
Characteristic  
Symbol  
Value  
Unit  
Thermal Resistance, Junction to Case  
Table 3. Moisture Sensitivity Level  
Test Methodology  
R
4
°C/W  
θ
JC  
Rating  
Package Peak Temperature  
Unit  
Per JESD 22-A113, IPC/JEDEC J-STD-020  
1
260  
°C  
T
T
C
J –  
1. Calculated based on the formula P  
=
D
R
θJC  
NOTE - CAUTION - MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and  
packaging MOS devices should be observed.  
© Freescale Semiconductor, Inc., 2006. All rights reserved.  

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