MBD110DWT1G,
MBD330DWT1G,
MBD770DWT1G
Preferred Device
Dual Schottky Barrier
Diodes
http://onsemi.com
Application circuit designs are moving toward the consolidation of
device count and into smaller packages. The new SOT−363 package is
a solution which simplifies circuit design, reduces device count, and
reduces board space by putting two discrete devices in one small
six−leaded package. The SOT−363 is ideal for low−power surface
mount applications where board space is at a premium, such as
portable products.
Anode 1
6 Cathode
5 N/C
N/C 2
Cathode 3
4 Anode
Surface Mount Comparisons:
SOT−363
SOT−23
7.6
2
Area (mm )
4.6
120
2
Max Package P (mW)
225
D
Device Count
1
1
Space Savings:
Package
SC−88 / SOT−363
CASE 419B
STYLE 6
1 ꢀ SOT−23
2 ꢀ SOT−23
SOT−363
40%
70%
The MBD110DW, MBD330DW, and MBD770DW devices are
spin−offs of our popular MMBD101LT1, MMBD301LT1, and
MMBD701LT1 SOT−23 devices. They are designed for
high−efficiency UHF and VHF detector applications. Readily
available to many other fast switching RF and digital applications.
MARKING DIAGRAM
6
Features
xx M G
• Extremely Low Minority Carrier Lifetime
• Very Low Capacitance
• Low Reverse Leakage
• These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
G
1
xx = Device Code
Refer to Ordering Table,
page 2
MAXIMUM RATINGS
M
= Date Code
G
= Pb−Free Package
Rating
Symbol
Value
Unit
(Note: Microdot may be in either location)
Reverse Voltage
MBD110DWT1G
MBD330DWT1G
MBD770DWT1G
V
R
7.0
30
70
V
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 2 of this data sheet.
Forward Power Dissipation T = 25°C
P
T
120
mW
°C
A
F
Junction Temperature
−55 to +125
−55 to +150
J
Preferred devices are recommended choices for future use
and best overall value.
Storage Temperature Range
T
stg
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
© Semiconductor Components Industries, LLC, 2009
1
Publication Order Number:
October, 2009 − Rev. 6
MBD110DWT1/D