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MBD110DWT1G_07 PDF预览

MBD110DWT1G_07

更新时间: 2024-11-23 11:12:23
品牌 Logo 应用领域
安森美 - ONSEMI 二极管
页数 文件大小 规格书
6页 145K
描述
Dual Schottky Barrier Diodes

MBD110DWT1G_07 数据手册

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MBD110DWT1G,  
MBD330DWT1G,  
MBD770DWT1G  
Preferred Device  
Dual Schottky Barrier  
Diodes  
http://onsemi.com  
Application circuit designs are moving toward the consolidation of  
device count and into smaller packages. The new SOT363 package is  
a solution which simplifies circuit design, reduces device count, and  
reduces board space by putting two discrete devices in one small  
sixleaded package. The SOT363 is ideal for lowpower surface  
mount applications where board space is at a premium, such as  
portable products.  
Anode 1  
6 Cathode  
5 N/C  
N/C 2  
Cathode 3  
4 Anode  
Surface Mount Comparisons:  
SOT363  
SOT23  
7.6  
2
Area (mm )  
4.6  
120  
2
Max Package P (mW)  
225  
D
Device Count  
1
1
Space Savings:  
Package  
SC88 / SOT363  
CASE 419B  
STYLE 6  
1 SOT23  
2 SOT23  
SOT363  
40%  
70%  
The MBD110DW, MBD330DW, and MBD770DW devices are  
spinoffs of our popular MMBD101LT1, MMBD301LT1, and  
MMBD701LT1 SOT23 devices. They are designed for  
highefficiency UHF and VHF detector applications. Readily  
available to many other fast switching RF and digital applications.  
MARKING DIAGRAM  
6
Features  
xx M G  
Extremely Low Minority Carrier Lifetime  
Very Low Capacitance  
Low Reverse Leakage  
These Devices are PbFree, Halogen Free/BFR Free and are RoHS  
Compliant  
G
1
xx = Device Code  
Refer to Ordering Table,  
page 2  
MAXIMUM RATINGS  
M
= Date Code  
G
= PbFree Package  
Rating  
Symbol  
Value  
Unit  
(Note: Microdot may be in either location)  
Reverse Voltage  
MBD110DWT1G  
MBD330DWT1G  
MBD770DWT1G  
V
R
7.0  
30  
70  
V
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on page 2 of this data sheet.  
Forward Power Dissipation T = 25°C  
P
T
120  
mW  
°C  
A
F
Junction Temperature  
55 to +125  
55 to +150  
J
Preferred devices are recommended choices for future use  
and best overall value.  
Storage Temperature Range  
T
stg  
°C  
Stresses exceeding Maximum Ratings may damage the device. Maximum  
Ratings are stress ratings only. Functional operation above the Recommended  
Operating Conditions is not implied. Extended exposure to stresses above the  
Recommended Operating Conditions may affect device reliability.  
© Semiconductor Components Industries, LLC, 2009  
1
Publication Order Number:  
October, 2009 Rev. 6  
MBD110DWT1/D  

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