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IRHMS593160 PDF预览

IRHMS593160

更新时间: 2024-11-04 22:48:07
品牌 Logo 应用领域
英飞凌 - INFINEON 晶体晶体管开关脉冲局域网
页数 文件大小 规格书
8页 174K
描述
RADIATION HARDENED POWER MOSFET THRU-HOLE (Low-Ohmic TO-254AA)

IRHMS593160 技术参数

是否Rohs认证:不符合生命周期:Active
包装说明:FLANGE MOUNT, S-CSFM-P3Reach Compliance Code:compliant
ECCN代码:EAR99风险等级:5.21
Is Samacsys:N雪崩能效等级(Eas):480 mJ
外壳连接:ISOLATED配置:SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压:100 V最大漏极电流 (Abs) (ID):45 A
最大漏极电流 (ID):45 A最大漏源导通电阻:0.05 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJEDEC-95代码:TO-254AA
JESD-30 代码:S-CSFM-P3JESD-609代码:e0
元件数量:1端子数量:3
工作模式:ENHANCEMENT MODE最高工作温度:150 °C
封装主体材料:CERAMIC, METAL-SEALED COFIRED封装形状:SQUARE
封装形式:FLANGE MOUNT峰值回流温度(摄氏度):NOT SPECIFIED
极性/信道类型:P-CHANNEL最大功率耗散 (Abs):250 W
最大脉冲漏极电流 (IDM):180 A认证状态:Not Qualified
子类别:Other Transistors表面贴装:NO
端子面层:Tin/Lead (Sn/Pb)端子形式:PIN/PEG
端子位置:SINGLE处于峰值回流温度下的最长时间:NOT SPECIFIED
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

IRHMS593160 数据手册

 浏览型号IRHMS593160的Datasheet PDF文件第2页浏览型号IRHMS593160的Datasheet PDF文件第3页浏览型号IRHMS593160的Datasheet PDF文件第4页浏览型号IRHMS593160的Datasheet PDF文件第5页浏览型号IRHMS593160的Datasheet PDF文件第6页浏览型号IRHMS593160的Datasheet PDF文件第7页 
                                                                         
PD - 94283B  
RADIATION HARDENED  
POWER MOSFET  
THRU-HOLE (Low-Ohmic TO-254AA)  
IRHMS597160  
100V, P-CHANNEL  
TECHNOLOGY  
5
™
Product Summary  
Part Number Radiation Level RDS(on)  
ID  
IRHMS597160 100K Rads (Si)  
IRHMS593160 300K Rads (Si)  
0.05-45A*  
0.05-45A*  
Low-Ohmic  
TO-254AA  
International Rectifier’s R5TM technology provides  
high performance power MOSFETs for space  
applications. These devices have been characterized  
for Single Event Effects (SEE) with useful performance  
up to an LET of 80 (MeV/(mg/cm2)). The combination  
of low RDS(on) and low gate charge reduces the  
power losses in switching applications such as DC  
to DC converters and motor control. These devices  
retain all of the well established advantages of  
MOSFETs such as voltage control, fast switching,  
ease of paralleling and temperature stability of  
electrical parameters.  
Features:  
n
n
n
n
n
n
n
n
n
n
n
n
Single Event Effect (SEE) Hardened  
Neutron Tolerant  
Identical Pre- and Post-Electrical Test Conditions  
Repetitive Avalanche Ratings  
Dynamic dv/dt Ratings  
Simple Drive Requirements  
Ease of Paralleling  
Hermetically Sealed  
Electically Isolated  
Ceramic Eyelets  
Light Weight  
High Electrical Conductive Package  
Absolute Maximum Ratings  
Pre-Irradiation  
Parameter  
Units  
I
@ V  
@ V  
= -12V, T = 25°C Continuous Drain Current  
-45*  
D
D
GS  
GS  
C
A
I
= -12V, T = 100°C Continuous Drain Current  
-30  
-180  
208  
C
I
Pulsed Drain Current À  
Max. Power Dissipation  
Linear Derating Factor  
Gate-to-Source Voltage  
DM  
@ T = 25°C  
P
W
W/°C  
V
D
C
1.67  
V
±20  
GS  
E
Single Pulse Avalanche Energy Á  
Avalanche Current À  
480  
mJ  
A
AS  
I
-45  
AR  
E
Repetitive Avalanche Energy À  
Peak Diode Recovery dv/dt   
Operating Junction  
20.8  
mJ  
V/ns  
AR  
dv/dt  
-6.0  
T
-55 to 150  
J
oC  
g
T
Storage Temperature Range  
STG  
Lead Temperature  
Weight  
300 (0.063in./1.6mm from case for 10s)  
9.3 ( Typical )  
* Current is limited by package  
For footnotes refer to the last page  
www.irf.com  
1
07/20/04  

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