PD - 96414
IRF7737L2TRPbF
IRF7737L2TR1PbF
DirectFET® Power MOSFET
V(BR)DSS
40V
•
•
Advanced Process Technology
Optimized for Industrial Motor Drive, DC-DC and
other Heavy Load Applications
Exceptionally Small Footprint and Low Profile
High Power Density
Low Parasitic Parameters
Dual Sided Cooling
Repetitive Avalanche Capability for Robustness and
Reliability
Lead Free, RoHS Compliant and Halogen Free
RDS(on) typ.
1.5m
1.9m
Ω
Ω
max.
ID (Silicon Limited)
Qg
•
•
•
•
•
156A
89nC
S
S
S
S
S
S
•
D
D
G
DirectFET® ISOMETRIC
Applicable DirectFET® Outline and Substrate Outline
L6
SB
SC
M2
M4
L4
L6
L8
Description
The IRF7737L2PbF combines the latest HEXFET® Power MOSFET Silicon technology with the advanced DirectFET® packaging technology to
achieve exceptional performance in a package that has the footprint of a DPak (TO-252AA) and only 0.7 mm profile. The DirectFET® package
is compatible with existing layout geometries used in power applications, PCB assembly equipment and vapor phase, infra-red or convection
soldering techniques, when application note AN-1035 is followed regarding the manufacturing methods and processes. The DirectFET® package
allows dual sided cooling to maximize thermal transfer.
This HEXFET® Power MOSFET is designed for applications where efficiency and power density are of value. The advanced DirectFET® packaging
platform coupled with the latest silicon technology allows the IRF7737L2PbF to offer substantial system level savings and performance improvement
specifically in motor drive, high frequency DC-DC and other heavy load applications. This MOSFET utilizes the latest processing techniques to
achieve low on-resistance and low Qg per silicon area. Additional features of this MOSFET are 175°C operating junction temperature and high
repetitive peak current capability. These features combine to make this MOSFET a highly efficient, robust and reliable device for high current
applications.
AbsoluteMaximumRatings
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only; and
functional operation of the device at these or any other condition beyond those indicated in the specifications is not implied.Exposure to absolute-
maximum-rated conditions for extended periods may affect device reliability. The thermal resistance and power dissipation ratings are measured
under board mounted and still air conditions. Ambient temperature (TA) is 25°C, unless otherwise specified.
Max.
Parameter
Units
40
Drain-to-Source Voltage
Gate-to-Source Voltage
V
V
DS
GS
V
± 20
Continuous Drain Current, VGS @ 10V (Silicon Limited)
Continuous Drain Current, VGS @ 10V (Silicon Limited)
Continuous Drain Current, VGS @ 10V (Silicon Limited)
Continuous Drain Current, VGS @ 10V (Package Limited)
Pulsed Drain Current
156
I
I
I
@ T = 25°C
C
D
D
D
110
@ T = 100°C
C
31
A
@ TA = 25°C
ID @ TC = 25°C
315
624
I
DM
83
P
P
@TC = 25°C
@TA = 25°C
Power Dissipation
D
D
W
3.3
Power Dissipation
EAS
104
386
Single Pulse Avalanche Energy (Thermally Limited)
Single Pulse Avalanche Energy Tested Value
Avalanche Current
mJ
EAS (tested)
IAR
A
See Fig.18a, 18b, 16, 17
EAR
Repetitive Avalanche Energy
mJ
270
Peak Soldering Temperature
T
T
T
P
-55 to + 175
°C
Operating Junction and
J
Storage Temperature Range
STG
Thermal Resistance
Parameter
Typ.
–––
12.5
20
Max.
45
Units
°C/W
W/°C
RθJA
Junction-to-Ambient
RθJA
Junction-to-Ambient
Junction-to-Ambient
Junction-to-Can
–––
–––
1.8
RθJA
RθJCan
RθJ-PCB
–––
–––
Junction-to-PCB Mounted
0.5
0.56
Linear Derating Factor
HEXFET® is a registered trademark of International Rectifier.
www.irf.com
1
10/27/11