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HN4B04J(TE85L) PDF预览

HN4B04J(TE85L)

更新时间: 2024-02-14 18:37:42
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
6页 248K
描述
HN4B04J(TE85L)

HN4B04J(TE85L) 技术参数

生命周期:Obsolete包装说明:,
Reach Compliance Code:unknown风险等级:5.84
Base Number Matches:1

HN4B04J(TE85L) 数据手册

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HN4B04J  
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process) Silicon NPN Epitaxial Type (PCT Process)  
HN4B04J  
Audio Frequency General Purpose Amplifier Applications  
Unit: mm  
Driver Stage Amplifier Applications  
Switching application  
Q1:  
z
Excellent hFE linearity  
: hFE(2) =25 (Min.) at VCE = 6V IC = 400mA  
Q2:  
z
Excellent hFE linearity  
: hFE(2) =25 (Min.) at VCE = 6V IC = 400mA  
1.BASE1  
2.EMITTER  
3.BASE2  
(B1)  
(E)  
(B2)  
Q1 Absolute Maximum Ratings (Ta = 25°C)  
4.COLLECTOR2 (C2)  
5.COLLECTOR1 (C1)  
Characteristic  
Symbol  
Rating  
Unit  
Collector-base voltage  
Collector-emitter voltage  
Emitter-base voltage  
Collector current  
V
V
V
35  
30  
5  
V
V
CBO  
CEO  
EBO  
JEDEC  
JEITA  
V
TOSHIBA  
2-3L1A  
I
500  
mA  
C
Weight: 0.014g (typ.)  
Q2 Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Symbol  
Rating  
Unit  
Collector-base voltage  
Collector-emitter voltage  
Emitter-base voltage  
Collector current  
V
V
V
35  
30  
5
V
V
CBO  
CEO  
EBO  
V
I
500  
mA  
C
Q1,Q2 Common Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Symbol  
P *  
Rating  
Unit  
Collector power dissipation  
Junction temperature  
300  
150  
mW  
°C  
C
T
j
Storage temperature range  
T
stg  
55~150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
*Total rating. Power dissipation per element should not exceed 200mW.  
1
2007-11-01  

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