July 2012
TM
UniFET-II
FDD4N60NZ
N-Channel MOSFET
600V, 3.4A, 2.5ꢀ
Features
Description
•
•
•
•
•
•
R
= 1.9ꢀ ( Typ.)@ V = 10V, I = 1.7A
These N-Channel enhancement mode power field effect
sistors are produced using Fairchild’s proprietary, planar stripe,
DMOS technology.
tran-
DS(on)
GS
D
Low Gate Charge ( Typ. 8.3nC)
Low C ( Typ. 3.7pF)
rss
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
formance, and withstand high energy pulse in the avalanche and
commutation mode. These devices are well suited for high effi-
cient switching mode power supplies and active power factor
correction.
per-
Fast Switching
100% Avalanche Tested
Improved dv/dt Capability
•
•
ESD Improved Capability
RoHS Compliant
D
D
G
G
S
D-PAK
S
o
MOSFET Maximum Ratings T = 25 C unless otherwise noted*
C
Symbol
Parameter
FDD4N60NZ
Units
V
V
Drain to Source Voltage
Gate to Source Voltage
600
±25
V
V
DSS
GSS
o
-Continuous (T = 25 C)
3.4
C
I
I
Drain Current
A
D
o
-Continuous (T = 100 C)
2
C
Drain Current
- Pulsed
(Note 1)
(Note 2)
(Note 1)
(Note 1)
(Note 3)
13.6
179.2
3.4
A
mJ
A
DM
E
Single Pulsed Avalanche Energy
Avalanche Current
AS
I
AR
E
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
11.4
5
mJ
V/ns
W
AR
dv/dt
o
(T = 25 C)
114
C
P
Power Dissipation
D
o
o
- Derate above 25 C
0.9
W/ C
o
T , T
Operating and Storage Temperature Range
-55 to +150
C
J
STG
Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
o
T
300
C
L
Thermal Characteristics
Symbol
Parameter
Thermal Resistance, Junction to Case
Thermal Resistance, Junction to Ambient
Units
FDD4N60NZ
R
R
1.1
θJC
θJA
o
C/W
110
©2012 Fairchild Semiconductor Corporation
FDD4N60NZ Rev.C0
1
www.fairchildsemi.com