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2SJ313-O(Q) PDF预览

2SJ313-O(Q)

更新时间: 2024-11-15 21:11:23
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
5页 242K
描述
TRANSISTOR,MOSFET,P-CHANNEL,180V V(BR)DSS,1A I(D),TO-220AB

2SJ313-O(Q) 技术参数

是否Rohs认证: 符合生命周期:Active
包装说明:,Reach Compliance Code:unknown
风险等级:5.61配置:Single
最大漏极电流 (Abs) (ID):1 AFET 技术:METAL-OXIDE SEMICONDUCTOR
工作模式:ENHANCEMENT MODE最高工作温度:150 °C
极性/信道类型:P-CHANNEL最大功率耗散 (Abs):25 W
子类别:Other Transistors表面贴装:NO
Base Number Matches:1

2SJ313-O(Q) 数据手册

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2SJ313  
TOSHIBA Field Effect Transistor Silicon P Channel MOS Type  
2SJ313  
Audio Frequency Power Amplifier Application  
Unit: mm  
z High breakdown voltage: V  
= 180 V  
DSS  
z High forward transfer admittance: |Y | = 0.7 S (typ.)  
fs  
z Complementary to 2SK2013  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Drainsource voltage  
Symbol  
Rating  
Unit  
V
V
180  
±20  
V
V
DSS  
JEDEC  
JEITA  
Gatesource voltage  
Drain current  
GSS  
SC-67  
(Note 1)  
I
1  
A
D
Power dissipation (Tc = 25°C)  
Channel temperature  
Storage temperature range  
P
25  
W
°C  
°C  
TOSHIBA  
2-10R1B  
D
ch  
stg  
T
150  
Weight: 1.9 g (typ.)  
T
55~150  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e.  
operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate  
reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and  
Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).  
1
2009-09-29  

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