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2SJ313-Y PDF预览

2SJ313-Y

更新时间: 2024-11-15 13:02:11
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体晶体管功率场效应晶体管放大器局域网
页数 文件大小 规格书
5页 372K
描述
TRANSISTOR 1 A, 180 V, P-CHANNEL, Si, POWER, MOSFET, LEAD FREE, 2-10R1B, SC-67, 3 PIN, FET General Purpose Power

2SJ313-Y 技术参数

是否无铅:含铅是否Rohs认证:不符合
生命周期:Lifetime Buy零件包装代码:SC-67
包装说明:2-10R1B, SC-67, 3 PIN针数:3
Reach Compliance Code:unknown风险等级:5.27
Is Samacsys:N外壳连接:ISOLATED
配置:SINGLE最小漏源击穿电压:180 V
最大漏极电流 (Abs) (ID):1 A最大漏极电流 (ID):1 A
FET 技术:METAL-OXIDE SEMICONDUCTORJESD-30 代码:R-PSFM-T3
元件数量:1端子数量:3
工作模式:ENHANCEMENT MODE最高工作温度:150 °C
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:FLANGE MOUNT峰值回流温度(摄氏度):NOT SPECIFIED
极性/信道类型:P-CHANNEL最大功率耗散 (Abs):25 W
认证状态:Not Qualified子类别:Other Transistors
表面贴装:NO端子面层:NOT SPECIFIED
端子形式:THROUGH-HOLE端子位置:SINGLE
处于峰值回流温度下的最长时间:NOT SPECIFIED晶体管应用:AMPLIFIER
晶体管元件材料:SILICONBase Number Matches:1

2SJ313-Y 数据手册

 浏览型号2SJ313-Y的Datasheet PDF文件第2页浏览型号2SJ313-Y的Datasheet PDF文件第3页浏览型号2SJ313-Y的Datasheet PDF文件第4页浏览型号2SJ313-Y的Datasheet PDF文件第5页 
2SJ313  
TOSHIBA Field Effect Transistor Silicon P Channel MOS Type  
2SJ313  
Audio Frequency Power Amplifier Application  
Unit: mm  
z High breakdown voltage: V  
= 180 V  
DSS  
z High forward transfer admittance: |Y | = 0.7 S (typ.)  
fs  
z Complementary to 2SK2013  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Drainsource voltage  
Symbol  
Rating  
Unit  
V
V
180  
±20  
V
V
DSS  
JEDEC  
JEITA  
Gatesource voltage  
Drain current  
GSS  
(Note 1)  
I
1  
A
SC-67  
D
Power dissipation (Tc = 25°C)  
Channel temperature  
Storage temperature range  
P
25  
W
°C  
°C  
D
ch  
stg  
TOSHIBA  
2-10R1B  
T
150  
Weight: 1.9 g (typ.)  
T
55~150  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e.  
operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate  
reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and  
Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).  
1
2006-11-16  

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