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2SA1359-Y PDF预览

2SA1359-Y

更新时间: 2024-11-22 21:11:27
品牌 Logo 应用领域
东芝 - TOSHIBA 局域网放大器晶体管
页数 文件大小 规格书
4页 149K
描述
TRANSISTOR 3 A, 40 V, PNP, Si, POWER TRANSISTOR, 2-8H1A, 3 PIN, BIP General Purpose Power

2SA1359-Y 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:FLANGE MOUNT, R-PSFM-T3针数:3
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8541.29.00.75风险等级:5.75
最大集电极电流 (IC):3 A集电极-发射极最大电压:40 V
配置:SINGLE最小直流电流增益 (hFE):120
JESD-30 代码:R-PSFM-T3元件数量:1
端子数量:3最高工作温度:150 °C
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:FLANGE MOUNT峰值回流温度(摄氏度):NOT SPECIFIED
极性/信道类型:PNP功耗环境最大值:10 W
最大功率耗散 (Abs):1.5 W认证状态:Not Qualified
子类别:Other Transistors表面贴装:NO
端子形式:THROUGH-HOLE端子位置:SINGLE
处于峰值回流温度下的最长时间:NOT SPECIFIED晶体管应用:AMPLIFIER
晶体管元件材料:SILICON标称过渡频率 (fT):100 MHz
VCEsat-Max:0.8 VBase Number Matches:1

2SA1359-Y 数据手册

 浏览型号2SA1359-Y的Datasheet PDF文件第2页浏览型号2SA1359-Y的Datasheet PDF文件第3页浏览型号2SA1359-Y的Datasheet PDF文件第4页 
2SA1359  
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process)  
2SA1359  
Audio Frequency Power Amplifier  
Low-Speed Switching  
Unit: mm  
Suitable for the output stage of 5-watt car radios and car stereos.  
Good h linearity  
FE  
Complementary to 2SC3422.  
Absolute Maximum Ratings (Tc = 25°C)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
CBO  
V
CEO  
V
EBO  
40  
40  
V
V
V
A
A
Collector-emitter voltage  
Emitter-base voltage  
Collector current  
5  
I
3  
C
Base current  
I
1  
B
Ta = 25°C  
Tc = 25°C  
1.5  
Collector power  
dissipation  
P
W
C
JEDEC  
JEITA  
10  
Junction temperature  
T
150  
°C  
°C  
j
Storage temperature range  
T
stg  
55 to 150  
TOSHIBA  
2-8H1A  
Weight: 0.82 g (typ.)  
Note: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating  
conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report  
and estimated failure rate, etc).  
1
2006-11-09  

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