Datasheet > 2N3906U_08

2N3906U_08

更新时间： 2024-11-30 07:28:35

品牌	Logo	应用领域
KEC		/
页数	文件大小	规格书
1页	18K
描述
USM PACKAGE

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中文翻译

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数据手册

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2N3906U_08 数据手册

SEMICONDUCTOR

MARKING SPECIFICATION

2N3906U

USM PACKAGE

1. Marking method

Laser Marking

2. Marking

No.

Item

Marking

Description

Device Mark

hFE Grade

2N3906U

2006. 1st Week

[0:1st Character, 1:2nd Character]

* Lot No.

Note) * Lot No. marking method

(A)

(B)

(C)

(D)

(E)

(F)

(G)

(H)

(I)

(J)

1 st Character

Character

arrangement

(1)

(2)

(3)

(4)

(5)

(6)

(7)

(8)

(9)

(0)

2nd Character

Year

Marking (Week)

Periode (Year)

Remark

1 st Year (2006)

2 nd Year (2007)

4 rd Year (2008)

4 th Year (2009)

2006-2010-2014...

2007-2011-2015...

2008-2012-2016...

2009-2013-2017...

Rotation for 4 years

2008. 8. 29

Revision No : 1

1/1

中文翻译

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