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2N3866AUB PDF预览

2N3866AUB

更新时间: 2024-11-23 22:49:23
品牌 Logo 应用领域
SEMICOA /
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描述
Chip Type 2C3866A Geometry 1007 Polarity NPN

2N3866AUB 技术参数

生命周期:Contact Manufacturer零件包装代码:SOT
包装说明:SMALL OUTLINE, R-CDSO-N3针数:3
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8541.21.00.95风险等级:5.02
最大集电极电流 (IC):0.4 A基于收集器的最大容量:3.5 pF
集电极-发射极最大电压:30 V配置:SINGLE
最高频带:ULTRA HIGH FREQUENCY BANDJESD-30 代码:R-CDSO-N3
元件数量:1端子数量:3
最高工作温度:200 °C封装主体材料:CERAMIC, METAL-SEALED COFIRED
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
极性/信道类型:NPN认证状态:Not Qualified
表面贴装:YES端子形式:NO LEAD
端子位置:DUAL晶体管应用:AMPLIFIER
晶体管元件材料:SILICONBase Number Matches:1

2N3866AUB 数据手册

  
Data Sheet No. 2C3866A  
Ge ne ric Pa c ka ge d Pa rts :  
2N3866, 2N3866A  
Chip Type 2C3866A  
Geometry 1007  
Polarity NPN  
Chip type 2C3866A by Semicoa  
Semiconductors provides perfor-  
mance similar to these devices.  
Product Summary:  
APPLICATIONS: Designed for amplifier,  
frequency multiplier and oscillator applica-  
tions. Suitable for output, driver and predriver  
stages in VHF and UHF equipment.  
Part Numbers:  
2N3866A, 2N3866, 2N3866AUB, SD3866A,  
SD3866AF, SQ3866A, SQ3866AF  
Features: Special Characteristics:  
ft = 950 MHz (type) at 50 mA/15V  
Mechanical Specifications  
Top  
Al - 15 kÅ min.  
Au - 6.5 kÅ nom.  
3.4 mils x 3.0 mils  
3.4 mils x 3.0 mils  
Metallization  
Backside  
Emitter  
Base  
Bonding Pad Size  
8 mils nominal  
Die Thickness  
Chip Area  
15 mils x 20 mils  
Silox Passivated  
Top Surface  
Electrical Characteristics  
TA = 25oC  
Parameter  
BVCEO  
Test conditions  
Min  
30  
Max  
---  
Unit  
V dc  
V dc  
V dc  
V dc  
µA  
IC = 5.0 mA  
BVCBO  
BVCER  
BVEBO  
ICEO  
IC = 100 µA  
55  
---  
IC = 5.0 mA, RBE = 10 Ohms  
IE = 100 µA  
55  
---  
3.5  
---  
---  
VCE = 28 V, VEB = 2.0 V  
IC = 360 mA dc, VCE = 5.0 V  
IC = 50 mA dc, VCE = 5.0 V  
20  
hFE1  
5.0  
10  
---  
---  
hFE2  
200  
---  
Due to limitations of probe testing, only dc parameters are tested. This must be done with pulse width less  
than 300 µs, duty cycle less than 2%.  

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