1SS370
TOSHIBA Diode Silicon Epitaxial Planar Type
1SS370
High Voltage, High Speed Switching Applications
Unit: mm
z Low forward voltage
: V
= 0.9V (typ.)
F (2)
z Fast reverse recovery time: t = 60ns (typ.)
rr
z Small total capacitance
z Small package
: C = 1.5pF (typ.)
T
: SC-70
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Maximum (peak) reverse voltage
Reverse voltage
V
250
200
V
V
RM
V
R
Maximum (peak) forward current
Average forward current
Surge current (10ms)
I
300
mA
mA
A
FM
I
100
O
I
2
FSM
P
JEDEC
―
Power dissipation
100
mW
°C
°C
EIAJ
SC−70
Junction temperature
T
j
125
1-2P1D
TOSHIBA
Weight: 0.006g
Storage temperature range
T
−55∼125
stg
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Electrical Characteristics (Ta = 25°C)
Test
Circuit
Characteristic
Symbol
Test Condition
= 10mA
Min
Typ.
Max
Unit
V
V
V
―
I
I
―
―
―
―
―
―
0.72
0.90
―
1.0
1.2
0.1
1.0
3.0
60
F (1)
F (2)
R (1)
R (2)
F
F
Forward voltage
―
―
―
―
―
= 100mA
I
I
V
V
V
= 50V
R
R
R
Reverse current
μA
= 200V
―
Total capacitance
C
T
= 0, f = 1MH
1.5
10
pF
ns
z
Reverse recovery time
t
I = 10mA, Fig.1
F
rr
1
2007-11-01