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RN1116F(TE85L,F) PDF预览

RN1116F(TE85L,F)

更新时间: 2024-11-11 20:50:51
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体管
页数 文件大小 规格书
8页 209K
描述
PRE-BIASED "DIGITAL" TRANSISTOR,50V V(BR)CEO,100MA I(C),SOT-416VAR

RN1116F(TE85L,F) 技术参数

是否Rohs认证: 符合生命周期:Obsolete
包装说明:,Reach Compliance Code:unknown
风险等级:5.84最大集电极电流 (IC):0.1 A
最小直流电流增益 (hFE):50元件数量:1
极性/信道类型:NPN最大功率耗散 (Abs):0.1 W
子类别:BIP General Purpose Small Signal表面贴装:YES
晶体管元件材料:SILICONBase Number Matches:1

RN1116F(TE85L,F) 数据手册

 浏览型号RN1116F(TE85L,F)的Datasheet PDF文件第2页浏览型号RN1116F(TE85L,F)的Datasheet PDF文件第3页浏览型号RN1116F(TE85L,F)的Datasheet PDF文件第4页浏览型号RN1116F(TE85L,F)的Datasheet PDF文件第5页浏览型号RN1116F(TE85L,F)的Datasheet PDF文件第6页浏览型号RN1116F(TE85L,F)的Datasheet PDF文件第7页 
RN1114F~RN1118F  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process)  
RN1114F,RN1115F,RN1116F,RN1117F,RN1118F  
Switching, Inverter Circuit, Interface Circuit  
and Driver Circuit Applications  
Unit: mm  
z With built-in bias resistors.  
z Simplify circuit design  
z Reduce a quantity of parts and manufacturing process  
z Complementary to RN2114F to 2118F  
Equivalent Circuit and Bias Resistor Values  
Type No.  
R (k)  
1
R (k)  
2
RN1114F  
RN1115F  
RN1116F  
RN1117F  
RN1118F  
1
10  
10  
10  
4.7  
10  
2.2  
4.7  
10  
47  
ESM  
JEDEC  
JEITA  
TOSHIBA  
2-2HA1A  
Weight: 2.3 mg (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Symbol  
Rating  
Unit  
Collector-base voltage  
RN1114F to 1118F  
Collector-emitter voltage  
V
V
50  
V
V
CBO  
CEO  
50  
RN1114F  
5
RN1115F  
6
7
Emitter-base voltage  
RN1116F  
RN1117F  
RN1118F  
V
V
EBO  
15  
25  
Collector current  
I
100  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
100  
C
RN1114F to 1118F  
T
150  
j
T
stg  
55 to 150  
°C  
Note:  
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly  
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute  
maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2010-04-06  

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