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RN1118FT(TE85L) PDF预览

RN1118FT(TE85L)

更新时间: 2024-11-02 19:58:55
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体管
页数 文件大小 规格书
8页 187K
描述
PRE-BIASED "DIGITAL" TRANSISTOR,50V V(BR)CEO,100MA I(C),SOT-416VAR

RN1118FT(TE85L) 技术参数

是否Rohs认证: 不符合生命周期:Active
包装说明:,Reach Compliance Code:unknown
风险等级:5.88最大集电极电流 (IC):0.1 A
最小直流电流增益 (hFE):50元件数量:1
极性/信道类型:NPN最大功率耗散 (Abs):0.1 W
子类别:BIP General Purpose Small Signal表面贴装:YES
晶体管元件材料:SILICONBase Number Matches:1

RN1118FT(TE85L) 数据手册

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RN1114FT~RN1118FT  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process)  
RN1114FT, RN1115FT, RN1116FT, RN1117FT, RN1118FT  
Switching, Inverter Circuit, Interface Circuit  
and Driver Circuit Applications  
Unit: mm  
z Built-in bias resistors  
z Enabling simplified circuit design  
z Enabling reduction in the quantity of parts and manufacturing process  
z Complementary to the RN2114FT to 2118FT  
Equivalent Circuit and Bias Resistor Values  
Type No.  
R (k)  
1
R (k)  
2
RN1114FT  
RN1115FT  
RN1116FT  
RN1117FT  
RN1118FT  
1
10  
10  
10  
4.7  
10  
2.2  
4.7  
10  
47  
JEDEC  
JEITA  
TOSHIBA  
2-1B1A  
Weight: 2.2 mg (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Symbol  
Rating  
Unit  
Collector-base voltage  
RN1114FT to 1118FT  
Collector-emitter voltage  
V
V
50  
V
V
CBO  
CEO  
50  
RN1114FT  
5
RN1115FT  
6
7
Emitter-base voltage  
RN1116FT  
RN1117FT  
RN1118FT  
V
V
EBO  
15  
25  
Collector current  
I
100  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
100  
C
RN1114FT to 1118FT  
T
150  
j
T
stg  
55 to 150  
°C  
Note:  
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly  
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute  
maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2010-04-06  

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