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NVH4L070N120M3S PDF预览

NVH4L070N120M3S

更新时间: 2024-11-06 11:13:35
品牌 Logo 应用领域
安森美 - ONSEMI /
页数 文件大小 规格书
8页 353K
描述
Silicon Carbide (SiC) MOSFET- EliteSiC, 70 mohm, 1200 V, M3S, TO247-4L

NVH4L070N120M3S 数据手册

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DATA SHEET  
www.onsemi.com  
Silicon Carbide (SiC)  
MOSFET – EliteSiC,  
65 mohm, 1200ꢀV, M3S,  
TO-247-4L  
V
R
MAX  
I MAX  
D
(BR)DSS  
DS(ON)  
1200 V  
87 mW @ 18 V  
34 A  
D
NVH4L070N120M3S  
Features  
G
S1: Driver Source  
S2: Power Source  
Typ. R  
= 65 mW @ V = 18 V  
GS  
DS(on)  
S1  
S2  
Ultra Low Gate Charge (Q  
= 57 nC)  
G(tot)  
NCHANNEL MOSFET  
High Speed Switching with Low Capacitance (C = 57 pF)  
oss  
100% Avalanche Tested  
AECQ101 Qualified and PPAP Capable  
This Device is Halide Free and RoHS Compliant with exemption 7a,  
PbFree 2LI (on second level interconnection)  
D
Typical Applications  
S2  
S1  
Automotive On Board Charger  
Automotive DCDC Converter for EV/HEV  
G
TO2474L  
CASE 340CJ  
MAXIMUM RATINGS (T = 25°C unless otherwise noted)  
J
Parameter  
DraintoSource Voltage  
GatetoSource Voltage  
Symbol  
Value  
Unit  
MARKING DIAGRAM  
V
DSS  
1200  
10/+22  
3/+18  
V
V
V
V
GS  
Recommended Operation Values T <175°C  
of GatetoSource Voltage  
V
GSop  
C
H4L070  
120M3S  
AYWWZZ  
Continuous Drain  
Current (Notes 1, 3)  
Steady  
State  
T =25°C  
C
I
D
34  
160  
24  
A
W
A
Power Dissipation  
(Note 1)  
P
D
Continuous Drain  
Current (Notes 1, 3)  
Steady T =100°C  
State  
I
D
C
H4L070120M3S = Specific Device Code  
Power Dissipation  
(Note 1)  
P
80  
W
A
D
A
Y
= Assembly Location  
= Year  
Pulsed Drain Current  
(Note 2)  
T
C
= 25°C  
I
98  
DM  
WW = Work Week  
ZZ  
= Lot Traceability  
Operating Junction and Storage Temperature  
Range  
T , T  
J
55 to  
+175  
°C  
A
stg  
Source Current (Body Diode)  
I
S
31  
91  
ORDERING INFORMATION  
T
C
= 25°C, V = 3 V  
GS  
Device  
Package  
Shipping  
Single Pulse DraintoSource Avalanche  
Energy (Note 4)  
E
AS  
mJ  
°C  
NVH4L070N120M3S TO2474L  
30 Units /  
Tube  
Maximum Lead Temperature for Soldering  
(1/25from case for 10 s)  
T
270  
L
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
1. The entire application environment impacts the thermal resistance values shown,  
they are not constants and are only valid for the particular conditions noted.  
2. Repetitive rating, limited by max junction temperature.  
3. The maximum current rating is based on typical R  
performance.  
AS  
DS(on)  
4. EAS of 91 mJ is based on starting T = 25°C; L = 1 mH, I = 13.5 A,  
J
V
= 100 V, V = 18 V.  
GS  
DD  
© Semiconductor Components Industries, LLC, 2021  
1
Publication Order Number:  
March, 2023 Rev. 0  
NVH4L070N120M3S/D  
 

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