NUP4060AXV6
4−Line Transient Voltage
Suppressor Array
This 4−line voltage transient suppressor array is designed for
application requiring transient voltage protection capability. It is
intended for use in over−transient voltage and ESD sensitive
equipment such as cell phones, portables, computers, printers and
other applications. This device features a common cathode design
which protects four independent lines in a single SOT−563 package.
http://onsemi.com
SOT−563 4−LINE TRANSIENT
VOLTAGE SUPPRESSOR
Features
• Protects up to 4 Lines in a Single SOT−563 Package
PIN ASSIGNMENT
• ESD Rating: IEC61000−4−2: Level 4
Contact (8 kV), Air (15 kV)
D
D
GND
1
2
3
6
5
4
1
2
• V Pin = 16 V Protection
CC
D1, D2, and D3 Pins = 6.8 V Protection
D
3
• Low Capacitance (< 7 pF @ 3 V) for D , D , and D
• This is a Pb−Free Device
1
2
3
V
CC
GND
Applications
MARKING
DIAGRAM
• Hand Held Portable Applications
• USB Interface
• Notebooks, Desktops, Servers
• SIM Card Protection
SOT−563
CASE 463A
STYLE 6
MT MG
6
G
1
1
MAXIMUM RATINGS (T = 25°C, unless otherwise specified)
J
MT = Specific Device Code
Symbol
Rating
Value
Unit
M
= Date Code
G
= Pb−Free Package
(Note: Microdot may be in either location)
P
1
Peak Power Dissipation
8x20 msec double exponential waveform,
(Note 1) D , D , and D
3
V
Diode
200
W
PK
CC
20
W
°C
°C
°C
1
2
ORDERING INFORMATION
T
J
Operating Junction Temperature Range
Storage Temperature Range
−40 to 125
−55 to 150
260
†
Device
Package
Shipping
T
T
STG
NUP4060AXV6T1G SOT−563 4000/Tape & Reel
(Pb−Free)
Lead Solder Temperature – Maximum
(10 seconds)
L
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
ESD
IEC 61000−4−2 Air
IEC 61000−4−2 Contact
15000
8000
V
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
1. Nonrepetitive current pulse per Figure 1.
© Semiconductor Components Industries, LLC, 2007
1
Publication Order Number:
January, 2007 − Rev. 1
NUP4060/D