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NUP4114

更新时间： 2024-11-23 12:34:19
品牌 Logo 应用领域
安森美 - ONSEMI 二极管
页数 文件大小 规格书
9页 174K
描述
Transient Voltage Suppressors ESD Protection Diodes with Low

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NUP4114 数据手册

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NUP4114 Series,  
SZNUP4114HMR6T1G  
Transient Voltage  
Suppressors  
ESD Protection Diodes with Low  
Clamping Voltage  
http://onsemi.com  
The NUP4114 transient voltage suppressors are designed to protect  
high speed data lines from ESD. Ultra−low capacitance and high level  
of ESD protection make these devices well suited for use in USB 2.0  
high speed applications.  
5
1
6
3
4
Features  
• Low Clamping Voltage  
• Small Body Outline Dimensions on SC−88 Package:  
0.082″ x 0.078″ (2.10 mm x 1.25 mm)  
2
• Low Body Height: 0.043″ (1.10 mm)  
MARKING  
DIAGRAMS  
• Stand−off Voltage: 5.5 V  
• Low Leakage  
• Response Time is Typically < 1.0 ns  
6
• IEC61000−4−2 Level 4 ESD Protection  
• These Devices are Pb−Free and are RoHS Compliant  
• AEC−Q101 Qualified and PPAP Capable − SZNUP4114  
• SZ Prefix for Automotive and Other Applications Requiring Unique  
Site and Control Change Requirements  
SC−88  
W1 SUFFIX  
CASE 419B  
X2 MG  
G
1
1
1
6
SC−88  
W1 SUFFIX  
CASE 419B  
Typical Applications  
• LVDS  
X4 MG  
G
• USB 2.0 High Speed Data Line and Power Line Protection  
• Digital Video Interface (DVI) and HDMI  
• Monitors and Flat Panel Displays  
• High Speed Communication Line Protection  
• Notebook Computers  
1
6
TSOP−6  
CASE 318G  
STYLE 12  
P4H MG  
G
1
1
• Gigabit Ethernet  
MAXIMUM RATINGS (T = 25°C unless otherwise noted)  
SOT−563  
CASE 463A  
6
J
P4MG  
G
Rating  
Symbol  
Value  
−40 to +125  
−55 to +150  
260  
Unit  
°C  
1
1
Operating Junction Temperature Range  
Storage Temperature Range  
T
J
XXX = Specific Device Code  
T
stg  
°C  
M
G
= Date Code  
= Pb−Free Package  
Lead Solder Temperature −  
T
°C  
L
Maximum (10 Seconds)  
(Note: Microdot may be in either location)  
IEC 61000−4−2 (ESD)  
Contact  
Air  
8
15  
kV  
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on page 4 of this data sheet.  
Stresses exceeding Maximum Ratings may damage the device. Maximum  
Ratings are stress ratings only. Functional operation above the Recommended  
Operating Conditions is not implied. Extended exposure to stresses above the  
Recommended Operating Conditions may affect device reliability.  
See Application Note AND8308/D for further description of survivability specs.  
©
Semiconductor Components Industries, LLC, 2012  
1
Publication Order Number:  
May, 2012 − Rev. 2  
NUP4114/D  
1234567...9

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