NSS1C200MZ4
100 V, 2.0 A, Low VCE(sat)
PNP Transistor
2
ON Semiconductor’s e PowerEdge family of low V
CE(sat)
transistors are miniature surface mount devices featuring ultra low
saturation voltage (V ) and high current gain capability. These
CE(sat)
are designed for use in low voltage, high speed switching applications
where affordable efficient energy control is important.
http://onsemi.com
Typical applications are DC−DC converters and power management
in portable and battery powered products such as cellular and cordless
phones, PDAs, computers, printers, digital cameras and MP3 players.
Other applications are low voltage motor controls in mass storage
products such as disc drives and tape drives. In the automotive
industry they can be used in air bag deployment and in the instrument
cluster. The high current gain allows e PowerEdge devices to be
driven directly from PMU’s control outputs, and the Linear Gain
(Beta) makes them ideal components in analog amplifiers.
−100 VOLTS, 2.0 AMPS
PNP LOW VCE(sat) TRANSISTOR
COLLECTOR
2,4
2
1
BASE
3
Features
EMITTER
• These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
MARKING
DIAGRAM
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
C
Rating
Symbol
Max
−100
−140
−7.0
1.0
Unit
Vdc
Vdc
Vdc
Adc
Adc
SOT−223
CASE 318E
STYLE 1
AYW
1C200G
Collector-Emitter Voltage
Collector-Base Voltage
Emitter-Base Voltage
Base Current − Continuous
V
CEO
V
CB
1
V
I
EB
A
Y
W
= Assembly Location
= Year
= Work Week
I
B
C
Collector Current − Continuous
Collector Current − Peak
2.0
3.0
1C200 = Specific Device Code
G
= Pb−Free Package
Total Power Dissipation
P
D
W
Total P @ T = 25°C (Note 1)
2.0
0.8
D
A
PIN ASSIGNMENT
Total P @ T = 25°C (Note 2)
D
A
4
Operating and Storage Junction
Temperature Range
T , T
−55 to
+150
°C
J
stg
C
THERMAL CHARACTERISTICS
Characteristic
Symbol
Max
Unit
B
C
E
3
1
2
Thermal Resistance,
R
°C/W
q
JA
Junction−to−Ambient (Note 1)
Junction−to−Ambient (Note 2)
64
155
Top View Pinout
ORDERING INFORMATION
Maximum Lead Temperature for
Soldering Purposes, 1/8″ from
case for 5 seconds
T
L
260
°C
†
Device
Package
Shipping
NSS1C200T1G
SOT−223
(Pb−Free)
1000/
Tape & Reel
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
NSS1C200T3G
SOT−223
(Pb−Free)
4000/
Tape & Reel
1. mounted on 1″ sq. (645 sq. mm) Collector pad on FR−4 bd material
2. mounted on 0.012″ sq. (7.6 sq. mm) Collector pad on FR−4 bd material
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
© Semiconductor Components Industries, LLC, 2010
1
Publication Order Number:
September, 2010 − Rev. 2
NSS1C200MZ4/D