NSS1C201L, NSV1C201L
100 V, 3.0 A, Low VCE(sat)
NPN Transistor
2
ON Semiconductor’s e PowerEdge family of low V
CE(sat)
transistors are miniature surface mount devices featuring ultra low
saturation voltage (V ) and high current gain capability. These
CE(sat)
are designed for use in low voltage, high speed switching applications
where affordable efficient energy control is important.
www.onsemi.com
Typical applications are DC−DC converters and power management
in portable and battery powered products such as cellular and cordless
phones, PDAs, computers, printers, digital cameras and MP3 players.
Other applications are low voltage motor controls in mass storage
products such as disc drives and tape drives. In the automotive
industry they can be used in air bag deployment and in the instrument
cluster. The high current gain allows e PowerEdge devices to be
driven directly from PMU’s control outputs, and the Linear Gain
(Beta) makes them ideal components in analog amplifiers.
100 VOLTS, 3.0 AMPS
NPN LOW VCE(sat) TRANSISTOR
COLLECTOR
3
2
1
Features
BASE
• NSV Prefix for Automotive and Other Applications Requiring
Unique Site and Control Change Requirements; AEC−Q101
Qualified and PPAP Capable
2
EMITTER
• These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
3
Compliant
MAXIMUM RATINGS (T = 25°C)
A
1
Rating
Symbol
Max
100
140
7.0
Unit
Vdc
Vdc
Vdc
A
2
Collector-Emitter Voltage
Collector-Base Voltage
Emitter-Base Voltage
V
CEO
SOT−23 (TO−236)
CASE 318
V
CBO
V
EBO
STYLE 6
Collector Current − Continuous
Collector Current − Peak
I
C
2.0
MARKING DIAGRAM
I
3.0
A
CM
THERMAL CHARACTERISTICS
Characteristic
VT MG
G
Symbol
Max
Unit
1
Total Device Dissipation
P
(Note 1)
490
mW
D
T = 25°C
Derate above 25°C
A
VT = Specific Device Code
3.7
mW/°C
°C/W
M
= Date Code*
Thermal Resistance,
Junction−to−Ambient
R
(Note 1)
255
q
JA
G
= Pb−Free Package
(Note: Microdot may be in either location)
Total Device Dissipation
P
(Note 2)
(Note 2)
710
mW
*Date Code orientation and/or overbar may
vary depending upon manufacturing location.
D
T = 25°C
A
Derate above 25°C
4.3
mW/°C
°C/W
Thermal Resistance,
Junction−to−Ambient
R
176
q
JA
ORDERING INFORMATION
†
Device
Package
Shipping
Junction and Storage
Temperature Range
T , T
−55 to
+150
°C
J
stg
NSS1C201LT1G,
NSV1C201LT1G
SOT−23
(Pb−Free)
3000 / Tape & Reel
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
2
1. FR−4 @ 100 mm , 1 oz. copper traces.
2
2. FR−4 @ 500 mm , 1 oz. copper traces.
© Semiconductor Components Industries, LLC, 2014
1
Publication Order Number:
December, 2014 − Rev. 5
NSS1C201L/D