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HUF75545S3S_NL PDF预览

HUF75545S3S_NL

更新时间: 2024-11-30 19:56:03
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD 开关晶体管
页数 文件大小 规格书
10页 211K
描述
Power Field-Effect Transistor, 75A I(D), 80V, 0.01ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263AB, LEAD FREE PACKAGE-3

HUF75545S3S_NL 技术参数

生命周期:Obsolete零件包装代码:D2PAK
包装说明:SMALL OUTLINE, R-PSSO-G2针数:3
Reach Compliance Code:unknownECCN代码:EAR99
风险等级:5.65外壳连接:DRAIN
配置:SINGLE WITH BUILT-IN DIODE最小漏源击穿电压:80 V
最大漏极电流 (ID):75 A最大漏源导通电阻:0.01 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJEDEC-95代码:TO-263AB
JESD-30 代码:R-PSSO-G2JESD-609代码:e3
元件数量:1端子数量:2
工作模式:ENHANCEMENT MODE封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
极性/信道类型:N-CHANNEL认证状态:Not Qualified
表面贴装:YES端子面层:MATTE TIN
端子形式:GULL WING端子位置:SINGLE
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

HUF75545S3S_NL 数据手册

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HUF75545P3, HUF75545S3, HUF75545S3S  
Data Sheet  
September 2002  
75A, 80V, 0.010 Ohm, N-Channel,  
®
UltraFET Power MOSFET  
Packaging  
JEDEC TO-220AB  
JEDEC TO-263AB  
DRAIN  
(FLANGE)  
Features  
SOURCE  
DRAIN  
GATE  
• Ultra Low On-Resistance  
- r  
= 0.010, VGS = 10V  
DS(ON)  
• Simulation Models  
GATE  
SOURCE  
- Temperature Compensated PSPICE® and SABER™  
Electrical Models  
DRAIN  
(FLANGE)  
HUF75545S3S  
- Spice and SABER Thermal Impedance Models  
- www.fairchildsemi.com  
HUF75545P3  
JEDEC TO-262AA  
SOURCE  
• Peak Current vs Pulse Width Curve  
• UIS Rating Curve  
DRAIN  
DRAIN  
(FLANGE)  
GATE  
Ordering Information  
HUF75545S3  
PART NUMBER  
HUF75545P3  
PACKAGE  
TO-220AB  
BRAND  
75545P  
Symbol  
D
S
HUF75545S3  
TO-262AA  
TO-263AB  
75545S  
75545S  
HUF75545S3S  
NOTE: When ordering, use the entire part number. Add the suffix T to  
obtain the TO-263AB variant in tape and reel, e.g., HUF75545S3ST.  
G
o
Absolute Maximum Ratings  
T
= 25 C, Unless Otherwise Specified  
C
HUF75545P3, HUF75545S3,  
HUF75545S3S  
UNITS  
Drain to Source Voltage (Note 1). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V  
80  
80  
V
V
V
DSS  
Drain to Gate Voltage (R  
= 20k) (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V  
GS  
DGR  
Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V  
±20  
GS  
Drain Current  
o
Continuous (T = 25 C, V  
C
= 10V) (Figure 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .I  
75  
73  
A
A
GS  
D
D
o
Continuous (T = 100 C, V  
= 10V) (Figure 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .I  
C
GS  
Pulsed Drain Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I  
Figure 4  
Figure 6  
270  
DM  
Pulsed Avalanche Rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . UIS  
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P  
W
D
o
o
Derate Above 25 C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
1.8  
W/ C  
o
Operating and Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T , T  
J
-55 to 175  
C
STG  
Maximum Temperature for Soldering  
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T  
Package Body for 10s, See Techbrief TB334. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .T  
o
300  
260  
C
C
L
o
pkg  
NOTES:  
1. T = 25 C to 150 C.  
o
o
J
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the  
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.  
Product reliability information can be found at http://www.fairchildsemi.com/products/discrete/reliability/index.html  
For severe environments, see our Automotive HUFA series.  
All Fairchild semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems certification.  
©2002 Fairchild Semiconductor Corporation  
HUF75545P3 / HUF75545S3 / HUF75545S3S Rev. C  

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