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2SA2065(TE85L,F)

更新时间: 2024-11-21 20:01:27
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
5页 149K
描述
TRANSISTOR,BJT,PNP,20V V(BR)CEO,1.5A I(C),SOT-346

2SA2065(TE85L,F) 技术参数

是否Rohs认证: 符合生命周期:Active
包装说明:,Reach Compliance Code:unknown
风险等级:5.57最大集电极电流 (IC):1.5 A
配置:Single最小直流电流增益 (hFE):200
最高工作温度:150 °C极性/信道类型:PNP
最大功率耗散 (Abs):0.75 W子类别:Other Transistors
表面贴装:YESBase Number Matches:1

2SA2065(TE85L,F) 数据手册

 浏览型号2SA2065(TE85L,F)的Datasheet PDF文件第2页浏览型号2SA2065(TE85L,F)的Datasheet PDF文件第3页浏览型号2SA2065(TE85L,F)的Datasheet PDF文件第4页浏览型号2SA2065(TE85L,F)的Datasheet PDF文件第5页 
2SA2065  
TOSHIBA Transistor Silicon PNP Epitaxial Type  
2SA2065  
High-Speed Switching Applications  
Unit: mm  
DC-DC Converter Applications  
Strobe Applications  
High DC current gain: h  
= 200 to 500 (I = 0.15 A)  
FE C  
Low collector-emitter saturation voltage: V  
= 0.14 V (max)  
CE (sat)  
High-speed switching: t = 37 ns (typ.)  
f
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
CBO  
V
CEO  
V
EBO  
20  
20  
V
V
V
Collector-emitter voltage  
Emitter-base voltage  
7  
DC  
I
1.5  
C
Collector current  
Base current  
A
Pulse  
I
2.5  
CP  
JEDEC  
JEITA  
I
150  
750  
mA  
mW  
B
t = 10 s  
DC  
P
C
Collector power  
dissipation  
TOSHIBA  
2-3S1C  
(Note 1)  
500  
Junction temperature  
T
j
150  
°C  
°C  
Weight: 0.01 g (typ.)  
Storage temperature range  
T
stg  
55 to 150  
2
Note 1: Mounted on an FR4 board (glass epoxy, 1.6 mm thick, Cu area: 645 mm )  
Note 2: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly  
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute  
maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2006-11-09  

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