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2N7002K-T1 PDF预览

2N7002K-T1

更新时间: 2024-02-07 13:23:00
品牌 Logo 应用领域
威世 - VISHAY /
页数 文件大小 规格书
9页 219K
描述
N-Channel 60-V (D-S) MOSFET

2N7002K-T1 数据手册

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2N7002K  
Vishay Siliconix  
SPECIFICATIONS T = 25 °C, unless otherwise noted  
A
Limits  
Typ.a  
Parameter  
Symbol  
Test Conditions  
Min.  
Max.  
Unit  
Static  
VDS  
VGS = 0 V, ID = 10 µA  
Drain-Source Breakdown Voltage  
60  
1
V
VGS(th)  
VDS = VGS, ID = 250 µA  
Gate-Threshold Voltage  
Gate-Body Leakage  
2.5  
10  
VDS = 0 V, VGS  
DS = 0 V, VGS  
=
=
=
20 V  
15 V  
10 V  
µA  
nA  
V
1
IGSS  
V
DS = 0 V, VGS  
150  
1000  
100  
1
V
DS = 0 V, VGS  
=
10 V, TJ = 85 °C  
5 V  
VDS = 60 V, VGS = 0 V  
V
DS = 0 V, VGS =  
IDSS  
Zero Gate Voltage Drain Current  
On-State Drain Currenta  
µA  
mA  
Ω
V
DS = 60 V, VGS = 0 V , TJ = 125 °C  
VGS = 10 V, VDS = 7.5 V  
500  
800  
500  
ID(on)  
V
GS = 4.5 V, VDS = 10 V  
VGS = 10 V, ID = 500 mA  
GS = 4.5 V, ID = 200 mA  
2
4
Drain-Source On-Resistancea  
RDS(on)  
V
Forward Transconductancea  
Diode Forward Voltage  
gfs  
VDS = 10 V, ID = 200 mA  
IS = 200 mA, VGS = 0 V  
100  
mS  
V
VSD  
1.3  
0.6  
Dynamica  
VDS = 10 V, VGS = 4.5 V  
Qg  
Total Gate Charge  
0.4  
nC  
pF  
ID 250 mA  
Ciss  
Coss  
Crss  
Input Capacitance  
30  
6
VDS = 25 V, VGS = 0 V  
f = 1 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
2.5  
Switchinga, b, c  
Turn-On Time  
Turn-Off Time  
td(on)  
td(off)  
25  
35  
VDD = 30 V, RL = 150 Ω  
ID 200 mA, VGEN = 10 V, RG = 10 Ω  
ns  
Notes:  
a. For DESIGN AID ONLY, not subject to production testing.  
b. Pulse test: PW 300 µs duty cycle 2 %.  
c. Switching time is essentially independent of operating temperature.  
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation  
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum  
rating conditions for extended periods may affect device reliability.  
www.vishay.com  
2
Document Number: 71333  
S09-0857-Rev. E, 18-May-09  

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