TPCA8022-H
TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (Ultra-High-Speed U-MOSIII)
TPCA8022-H
Switching Regulator Applications
Unit: mm
Motor Drive Applications
0.4±0.1
1.27
0.05
M A
5
8
DC/DC Converter Applications
0.15±0.05
•
•
•
Small footprint due to a small and thin package
High speed switching
4
0.595
A
1
Low drain-source ON-resistance
R
= 17 mΩ (typ.) (V =10V, I =11A)
GS D
:
DS (ON)
5.0±0.2
•
•
•
High forward transfer admittance: |Y | = 46 S (typ.)
fs
Low leakage current: I
= 10 μA (max) (V
= 100 V)
DSS
DS
0.05
S
S
Enhancement mode: V = 2.0 to 4.0 V (V
= 10 V, I = 1 mA)
D
1
4
th
DS
Absolute Maximum Ratings (Ta = 25°C)
4.25±0.2
Characteristic
Drain-source voltage
Symbol
Rating
Unit
8
5
0.8±0.1
1,2,3:SOURCE
5,6,7,8:DRAIN
4:GATE
V
100
100
±20
22
V
V
V
DSS
V
Drain-gate voltage (R
Gate-source voltage
= 20 kΩ)
JEDEC
―
―
DGR
GS
V
GSS
JEITA
DC
(Note 1)
I
D
TOSHIBA
2-5Q1A
Drain current
A
Pulsed (Note 1)
I
66
DP
Weight: 0.069 g (typ.)
Drain power dissipation
Drain power dissipation
(Tc=25℃)
(t = 10 s)
(Note 2a)
(t = 10 s)
(Note 2b)
P
45
W
W
D
D
P
2.8
1.6
Circuit Configuration
Drain power dissipation
P
W
D
8
7
6
5
Single-pulse avalanche energy
(Note 3)
E
197
22
mJ
A
AS
Avalanche current
I
AR
Repetitive avalanche energy
E
3.8
mJ
AR
(Note 2a) (Note 4)
T
T
150
°C
°C
1
2
3
4
Channel temperature
ch
−55 to 150
Storage temperature range
stg
Note: For Notes 1 to 4, refer to the next page.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate
reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and
Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
This transistor is an electrostatic-sensitive device. Handle with care.
1
2007-02-09