TPCA8004-H
TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (Ultra-High-Speed U-MOSIII)
TPCA8004-H
High Efficiency DC/DC Converter Applications
Unit: mm
Notebook PC Applications
0.4±0.1
1.27
0.5±0.1
0.05
M A
5
8
Portable Equipment Applications
0.15±0.05
•
•
•
•
•
•
•
Small footprint due to a small and thin package
High speed switching
4
0.595
A
1
Small gate charge: Q
SW
=12.7 nC (typ.)
5.0±0.2
Low drain-source ON-resistance: R
DS (ON)
= 3.5 mΩ (typ.)
0.95±0.05
0.166±0.05
High forward transfer admittance: |Y | =80 S (typ.)
fs
0.05
S
S
Low leakage current: I
= 10 µA (max) (V
= 30 V)
= 10 V, I = 1 mA)
DSS
DS
1.1±0.2
1
4
Enhancement mode: V = 1.1 to 2.3 V (V
th DS
D
4.25±0.2
Absolute Maximum Ratings (Ta = 25°C)
8
5
0.8±0.1
1,2,3:SOURCE
5,6,7,8:DRAIN
4:GATE
Characteristic
Drain-source voltage
Symbol
Rating
Unit
V
30
30
V
V
V
DSS
JEDEC
―
―
V
DGR
Drain-gate voltage (R
= 20 kΩ)
GS
JEITA
V
±20
40
Gate-source voltage
GSS
TOSHIBA
2-5Q1A
DC
(Note 1)
I
D
Drain current
A
Weight: 0.069 g (typ.)
Pulsed (Note 1)
I
120
45
DP
Drain power dissipation
Drain power dissipation
(Tc=25℃)
(t = 10 s)
(Note 2a)
(t = 10 s)
(Note 2b)
P
W
W
D
D
P
2.8
1.6
Circuit Configuration
Drain power dissipation
P
W
D
8
7
6
5
Single-pulse avalanche energy
(Note 3)
E
208
40
mJ
A
AS
Avalanche current
I
AR
Repetitive avalanche energy
E
4.5
mJ
AR
(Tc=25℃) (Note 4)
T
T
150
°C
°C
1
2
3
4
Channel temperature
ch
−55 to 150
Storage temperature range
stg
Note: For Notes 1 to 4, refer to the next page.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate
reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and
Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
This transistor is an electrostatic-sensitive device. Handle with care.
1
2006-11-16