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TPC8052-H(TE12L,Q) PDF预览

TPC8052-H(TE12L,Q)

更新时间: 2024-02-21 19:24:41
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
7页 207K
描述
Trans MOSFET N-CH 40V 12A 8-Pin SOP T/R

TPC8052-H(TE12L,Q) 技术参数

是否Rohs认证: 符合生命周期:End Of Life
包装说明:,Reach Compliance Code:unknown
风险等级:5.69配置:Single
最大漏极电流 (Abs) (ID):12 AFET 技术:METAL-OXIDE SEMICONDUCTOR
工作模式:ENHANCEMENT MODE最高工作温度:150 °C
极性/信道类型:N-CHANNEL最大功率耗散 (Abs):1.9 W
子类别:FET General Purpose Power表面贴装:YES
Base Number Matches:1

TPC8052-H(TE12L,Q) 数据手册

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TPC8052-H  
TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (U-MOS-H)  
TPC8052-H  
Switching Regulator Applications  
Motor Drive Applications  
Unit: mm  
DC-DC Converter Applications  
Small footprint due to a small and thin package  
High-speed switching  
Small gate charge: Q  
= 6.6 nC (typ.)  
SW  
Low drain-source ON-resistance:  
= 7.4 mΩ (typ.)  
R
DS (ON)  
High forward transfer admittance: |Y | = 40 S (typ.)  
fs  
Low leakage current: I  
= 10 μA (max) (V  
= 40 V)  
DSS  
DS  
Enhancement mode: V = 1.3 to 2.3 V (V  
= 10 V, I = 0.2 mA)  
D
th  
DS  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Drain-source voltage  
Symbol  
Rating  
Unit  
V
40  
40  
V
V
V
DSS  
V
Drain-gate voltage (R  
Gate-source voltage  
= 20 kΩ)  
DGR  
GS  
V
±20  
12  
GSS  
JEDEC  
JEITA  
DC  
(Note 1)  
I
D
Drain current  
A
Pulsed (Note 1)  
I
48  
DP  
Drain power dissipation  
Drain power dissipation  
(t = 10 s)  
(Note 2a)  
TOSHIBA  
2-6J1B  
P
1.9  
1.0  
W
W
D
D
Weight: 0.085g (typ.)  
(t = 10 s)  
(Note 2b)  
P
Single-pulse avalanche energy  
(Note 3)  
E
67  
12  
mJ  
A
AS  
Circuit Configuration  
Avalanche current  
I
AR  
8
7
6
5
Repetitive avalanche energy  
E
0.08  
mJ  
AR  
(Tc=25) (Note 4)  
T
T
150  
°C  
°C  
Channel temperature  
ch  
55 to 150  
Storage temperature range  
stg  
Note: For Notes 1 to 4, refer to the next page.  
1
2
3
4
Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the  
reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are  
within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba  
Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual  
reliability data (i.e. reliability test report and estimated failure rate, etc).  
This transistor is an electrostatic-sensitive device. Handle with care.  
1
2009-08-17  

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