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TPC8042

更新时间: 2024-11-02 05:52:43
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体晶体管场效应晶体管
页数 文件大小 规格书
7页 201K
描述
Field Effect Transistor Silicon N Channel MOS Type (U-MOS IV)

TPC8042 技术参数

生命周期:Lifetime Buy包装说明:SMALL OUTLINE, R-PDSO-G8
针数:8Reach Compliance Code:unknown
ECCN代码:EAR99风险等级:5.38
配置:SINGLE WITH BUILT-IN DIODE最小漏源击穿电压:30 V
最大漏极电流 (ID):18 A最大漏源导通电阻:0.0065 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJESD-30 代码:R-PDSO-G8
元件数量:1端子数量:8
工作模式:ENHANCEMENT MODE封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
极性/信道类型:N-CHANNEL认证状态:Not Qualified
表面贴装:YES端子形式:GULL WING
端子位置:DUAL晶体管应用:SWITCHING
晶体管元件材料:SILICONBase Number Matches:1

TPC8042 数据手册

 浏览型号TPC8042的Datasheet PDF文件第2页浏览型号TPC8042的Datasheet PDF文件第3页浏览型号TPC8042的Datasheet PDF文件第4页浏览型号TPC8042的Datasheet PDF文件第5页浏览型号TPC8042的Datasheet PDF文件第6页浏览型号TPC8042的Datasheet PDF文件第7页 
TPC8042  
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (U-MOS IV)  
TPC8042  
Lithium-Ion Battery Applications  
Unit: mm  
Portable Equipment Applications  
Notebook PC Applications  
Small footprint due to a small and thin package  
Low drain-source ON-resistance: R = 2.7 mΩ (typ.)  
DS (ON)  
High forward transfer admittance: |Y | = 42 S (typ.)  
fs  
Low leakage current: I  
= 10 μA (max) (V  
= 30 V)  
DSS  
DS  
Enhancement mode: V = 1.3 to 2.5 V (V  
= 10 V, I = 1 mA)  
D
th  
DS  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Drain-source voltage  
Symbol  
Rating  
Unit  
V
30  
30  
V
V
V
DSS  
V
Drain-gate voltage (R  
Gate-source voltage  
= 20 kΩ)  
DGR  
GS  
V
±20  
18  
GSS  
DC  
(Note 1)  
I
JEDEC  
JEITA  
D
Drain current  
A
Pulse (Note 1)  
I
72  
DP  
Drain power dissipation  
Drain power dissipation  
(t = 10 s)  
(Note 2a)  
TOSHIBA  
2-6J1B  
P
1.9  
1.0  
W
W
D
D
Weight: 0.08 g (typ.)  
(t = 10 s)  
(Note 2b)  
P
Single pulse avalanche energy  
(Note 3)  
E
84  
18  
mJ  
A
AS  
Circuit Configuration  
Avalanche current  
I
AR  
8
7
6
5
Repetitive avalanche energy  
E
0.044  
mJ  
AR  
(Note 2a) (Note 4)  
T
T
150  
°C  
°C  
Channel temperature  
ch  
55 to 150  
Storage temperature range  
stg  
Note: For Notes 1 to 4, refer to the next page.  
Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the  
1
2
3
4
reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.)  
are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
This transistor is an electrostatic-sensitive device. Handle with care.  
1
2009-09-29  

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