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TPC8041 PDF预览

TPC8041

更新时间: 2024-11-02 05:52:43
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体小信号场效应晶体管开关光电二极管
页数 文件大小 规格书
7页 195K
描述
Field Effect Transistor Silicon N Channel MOS Type (U-MOS IV)

TPC8041 技术参数

生命周期:End Of Life包装说明:SMALL OUTLINE, R-PDSO-G8
针数:8Reach Compliance Code:unknown
ECCN代码:EAR99风险等级:5.35
Is Samacsys:N配置:SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压:30 V最大漏极电流 (ID):13 A
最大漏源导通电阻:0.0135 ΩFET 技术:METAL-OXIDE SEMICONDUCTOR
JESD-30 代码:R-PDSO-G8元件数量:1
端子数量:8工作模式:ENHANCEMENT MODE
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:SMALL OUTLINE极性/信道类型:N-CHANNEL
认证状态:Not Qualified表面贴装:YES
端子形式:GULL WING端子位置:DUAL
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

TPC8041 数据手册

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TPC8041  
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (U-MOS IV)  
TPC8041  
Lithium Ion Battery Applications  
Unit: mm  
Portable Equipment Applications  
Notebook PC Applications  
Small footprint due to small and thin package  
Low drain-source ON-resistance: R = 5.5 mΩ (typ.)  
DS (ON)  
High forward transfer admittance: |Y | = 26 S (typ.)  
fs  
Low leakage current: I  
= 10 μA (max) (V  
= 30 V)  
DSS  
DS  
Enhancement mode: V = 1.3 to 2.5 V (V  
= 10 V, I = 1 mA)  
D
th  
DS  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Drain-source voltage  
Symbol  
Rating  
Unit  
V
30  
30  
V
V
V
DSS  
V
Drain-gate voltage (R  
Gate-source voltage  
= 20 kΩ)  
DGR  
GS  
V
±20  
13  
GSS  
DC  
(Note 1)  
I
D
JEDEC  
JEITA  
Drain current  
A
Pulse (Note 1)  
I
52  
DP  
Drain power dissipation  
Drain power dissipation  
(t = 10 s)  
(Note 2a)  
(t = 10 s)  
(Note 2b)  
P
1.9  
1.0  
W
W
D
D
TOSHIBA  
2-6J1B  
Weight: 0.08 g (typ.)  
P
Single pulse avalanche energy  
(Note 3)  
E
44  
13  
mJ  
A
AS  
Circuit Configuration  
Avalanche current  
I
AR  
8
7
6
5
Repetitive avalanche energy  
E
0.066  
mJ  
AR  
(Note 2a) (Note 4)  
T
T
150  
°C  
°C  
Channel temperature  
ch  
55 to 150  
Storage temperature range  
stg  
Note: Note 1, Note 2, Note 3 and Note 4: See the next page.  
1
2
3
4
Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating  
conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report  
and estimated failure rate, etc).  
This transistor is an electrostatic-sensitive device. Please handle with caution.  
1
2009-09-29  

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