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S2080

更新时间: 2024-11-01 07:20:35
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泰科 - TE 晶体晶体管
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描述
Moisture Effects on the Soldering of Plastic Encapsulated Devices

S2080 数据手册

 浏览型号S2080的Datasheet PDF文件第2页 
Application Note  
S2080  
Moisture Effects on the Soldering of Plastic Encapsulated  
Devices  
Rev. V5  
240°C, followed by  
a
ramp-down back to room  
Introduction  
temperature. The lead-free/RoHS solder profile includes  
a preheat to 200°C, followed by 60 - 150 seconds above  
217°C with a maximum temperature of 260°C. Please  
consult JEDEC for the complete profile.  
Improper packaging, storage, and handling of plastic  
encapsulated devices (PED’s) can trap moisture within  
the devices and lead to damage during reflow soldering  
to printed circuit boards. As part of reliability qualification  
and testing, M/A-COM tests and classifies all  
semiconductor devices for moisture sensitivity to assure  
After the convection reflow procedure, we examine the  
devices for failures. JEDEC defines moisture-induced  
solder stress failures as any external cracks visible with a  
40X optical microscope, DC electrical or functional  
failures, and most internal cracks, especially those that  
intersect a bond wire or ball/wedge bond. M/A-COM also  
examines the devices for any delaminating associated  
with moisture sensitivity.  
long term reliability.  
This application note briefly  
describes the moisture-induced soldering failure  
mechanism and test procedures, and moisture  
sensitivities of M/A-COM’s plastic packaged  
semiconductors.  
Moisture Induced Soldering Failures  
Moisture inside a plastic package turns to vapor and tries  
to expand when the package is exposed to rapid high  
M/A-COM performs these tests on any devices with  
different package type, mold compound, or die pad area  
relative to devices that we have already tested.  
temperatures during soldering.  
The internal vapor  
pressure can cause separation of the plastic encapsulant  
from the semiconductor chip or lead frame, internal and  
external cracks, and damage to thin films and wire  
bonds. In severe cases, soldering may cause an  
integrated circuit to bulge and then explode with an  
audible pop. Compared to through-hole devices, surface  
mount devices (SMD’s) have thinner plastic capsules  
and come into more intimate contact with high  
temperatures. Therefore, measures to limit and reduce  
the ingress of moisture during handling and storage of  
SMD’s are generally more critical for SMD’s than for  
through-hole devices. To reduce the effects of moisture-  
induced stress during soldering, M/A-COM recommends  
bake-out of some of its most moisture sensitive devices  
before reflow soldering according to standard industry  
procedures.  
Moisture Absorption and Floor Life  
After bake-out for removal of moisture, all PED’s  
eventually reach a condition of humidity equilibrium  
between the inside and outside of the package. JEDEC  
defines the time at which the moisture inside the package  
reaches a level likely to induce failure as the “floor life”.  
The rate of moisture absorption depends upon ambient  
temperature and humidity conditions, so JEDEC defines  
the floor life under specific ambient conditions. Devices  
stored beyond the floor life require a bake-out before  
reflow soldering to avoid possible damage. M/A-COM  
includes moisture sensitivity labels with all PED’s that  
have a limited floor life and might need bake-out.  
Moisture Sensitivity Ratings  
Moisture Test Methods  
Devices with sensitivity to moisture-induced solder stress  
should be shipped and stored in sealed, dry containers  
with a desiccant. As explained above, sensitive devices  
require a bake-out to remove moisture prior to reflow  
soldering if stored in typical ambient conditions beyond  
the floor life, or damage could result.  
M/A-COM tests its PED’s according to the procedures  
outlined by the standards organization JEDEC. We will  
briefly summarize the procedures here, but we  
recommend that the reader consult IPC/JEDEC J-STD-  
020, J-STD-033 and JESD22-A113 for detailed  
explanation of test procedures and failure criteria. For  
information on surface mounting consult application note  
M538 or S2083.  
Based on the floor life, JEDEC outlines six levels of  
moisture sensitivity as shown in Table 1. Level 1 devices  
are considered not sensitive to moisture, and have an  
unlimited floor life. These devices do not require dry pack  
shipping, and do not require bake-out prior to reflow  
soldering. Devices above level 2 are considered moisture  
sensitive, and require dry pack shipping and bake out.  
Level 6 devices are considered extremely moisture  
sensitive. The JEDEC guidelines specify that the user  
should reduce or eliminate reflow heating by mounting  
these PED’s on sockets or by performing a bake-out on  
the devices immediately before reflow soldering.  
As recommended by JEDEC, we start with a sample of  
known good parts and subject the parts to a 24-hour  
bake-out at 125°C to remove all moisture. Next we place  
the parts in a moist, warm environment for a prescribed  
period of time, as outlined in Table 1 under “soak  
requirements”. Within four hours of removing them from  
the soak, we then subject the parts to three cycles of  
convection reflow with the temperature profile  
recommended by JEDEC. The tin-lead eutectic solder  
profile includes a preheat to 150°C, followed by 60 - 150  
seconds above 180°C with a maximum temperature of  
1
North America Tel: 800.366.2266 Europe Tel: +353.21.244.6400  
Visit www.macomtech.com for additional data sheets and product information.  
India Tel: +91.80.4155721  
China Tel: +86.21.2407.1588  
M/A-COM Technology Solutions Inc. and its affiliates reserve the right to make  
changes to the product(s) or information contained herein without notice.  

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