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RN1967FS(TPL3) PDF预览

RN1967FS(TPL3)

更新时间: 2024-11-10 06:40:59
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
6页 107K
描述
Digital Transistors 10K x 47Kohms Polarity=NPNx2

RN1967FS(TPL3) 数据手册

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RN1967FS~RN1969FS  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT process) (Bias Resistor built-in Transistor)  
RN1967FS,RN1968FS,RN1969FS  
Switching, Inverter Circuit, Interface Circuit and  
Driver Circuit Applications  
Unit: mm  
1.0±0.05  
Two devices are incorporated into a fine pitch Small Mold (6 pin)  
package.  
0.8±0.05  
0.1±0.05  
0.1±0.05  
Incorporating a bias resistor into a transistor reduces parts count.  
1
6
5
Reducing the parts count enable the manufacture of ever more  
compact equipment and save assembly cost.  
2
Complementary to RN2967FS~RN2969FS  
4
3
Equivalent Circuit and Bias Resistor Values  
C
Type No.  
R1 (kΩ)  
R2 (kΩ)  
(E1)  
1.EMIITTER1  
2.EMITTER2  
3.BASE2  
4.COLLECTOR2  
5.BASE1  
(E2)  
(B2)  
(C2)  
(B1)  
(C1)  
R1  
RN1967FS  
RN1968FS  
RN1969FS  
10  
22  
47  
47  
47  
22  
B
E
fS6  
6.COLLECTOR1  
JEDEC  
JEITA  
TOSHIBA  
2-1F1C  
Weight: 0.001 g (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
(Q1, Q2 common)  
Equivalent Circuit  
(top view)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
6
5
4
V
V
20  
V
V
CBO  
CEO  
RN1967FS~  
1969FS  
Collector-emitter voltage  
20  
Q2  
Q1  
RN1967FS  
RN1968FS  
RN1969FS  
6
7
Emitter-base voltage  
V
C
V
EBO  
15  
1
2
3
Collector current  
I
50  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
(Note 1)  
50  
RN1967FS~  
RN1969FS  
T
j
150  
55~150  
T
°C  
stg  
Note:  
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly  
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute  
maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1: Total rating  
1
2007-11-01  

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