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RN1909FE(TPL3,F) PDF预览

RN1909FE(TPL3,F)

更新时间: 2024-11-16 08:11:39
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体管
页数 文件大小 规格书
6页 326K
描述
PRE-BIASED "DIGITAL" TRANSISTOR,50V V(BR)CEO,100MA I(C),TSOP

RN1909FE(TPL3,F) 技术参数

是否Rohs认证: 符合生命周期:Active
包装说明:,Reach Compliance Code:unknown
风险等级:5.8最大集电极电流 (IC):0.1 A
最小直流电流增益 (hFE):70元件数量:2
极性/信道类型:NPN最大功率耗散 (Abs):0.1 W
子类别:BIP General Purpose Small Signal表面贴装:YES
晶体管元件材料:SILICONBase Number Matches:1

RN1909FE(TPL3,F) 数据手册

 浏览型号RN1909FE(TPL3,F)的Datasheet PDF文件第2页浏览型号RN1909FE(TPL3,F)的Datasheet PDF文件第3页浏览型号RN1909FE(TPL3,F)的Datasheet PDF文件第4页浏览型号RN1909FE(TPL3,F)的Datasheet PDF文件第5页浏览型号RN1909FE(TPL3,F)的Datasheet PDF文件第6页 
RN1907FE~RN1909FE  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT process) (Bias Resistor Built-in Transistor)  
RN1907FE, RN1908FE, RN1909FE  
Switching, Inverter Circuit, Interface Circuit and  
Unit: mm  
Driver Circuit Applications  
Two devices are incorporated into an Extreme-Super-Mini (6-pin)  
package.  
Incorporating a bias resistor into a transistor reduces parts count.  
Reducing the parts count enables the manufacture of ever more  
compact equipment and lowers assembly cost.  
Complementary to RN2907FE~RN2909FE  
Equivalent Circuit and Bias Resistor Values  
C
Type No.  
R1 (kΩ)  
R2 (kΩ)  
RN1907FE  
RN1908FE  
RN1909FE  
10  
22  
47  
47  
47  
22  
R1  
B
JEDEC  
JEITA  
E
TOSHIBA  
2-2N1G  
Weight: 0.003 g (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
(Q1, Q2 common)  
Equivalent Circuit  
(top view)  
6
5
4
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
V
50  
50  
V
V
CBO  
CEO  
RN1907FE~  
RN1909FE  
Collector-emitter voltage  
Q2  
3
Q1  
RN1907FE  
RN1908FE  
RN1909FE  
6
Emitter-base voltage  
V
C
V
7
EBO  
1
2
15  
Collector current  
I
100  
100  
150  
55~150  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
(Note 1)  
RN1907FE~  
RN1909FE  
T
j
T
stg  
°C  
Note:  
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly  
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute  
maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1: Total rating  
1
2007-11-01  

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