NSS12601CF8T1G
12 V, 8.0 A, Low VCE(sat)
NPN Transistor
2
ON Semiconductor's e PowerEdge family of low V
CE(sat)
transistors are miniature surface mount devices featuring ultra low
saturation voltage (V ) and high current gain capability. These
CE(sat)
are designed for use in low voltage, high speed switching applications
where affordable efficient energy control is important.
http://onsemi.com
Typical applications are DC-DC converters and power management
in portable and battery powered products such as cellular and cordless
phones, PDAs, computers, printers, digital cameras and MP3 players.
Other applications are low voltage motor controls in mass storage
products such as disc drives and tape drives. In the automotive
industry they can be used in air bag deployment and in the instrument
cluster. The high current gain allows e PowerEdge devices to be
driven directly from PMU's control outputs, and the Linear Gain
(Beta) makes them ideal components in analog amplifiers.
12 VOLTS, 8.0 AMPS
NPN LOW VCE(sat) TRANSISTOR
EQUIVALENT RDS(on) 30 mW
COLLECTOR
1, 2, 3, 6, 7, 8
2
4
BASE
•ꢀThis is a Pb-Free Device
MAXIMUM RATINGS (T = 25°C)
A
5
EMITTER
Rating
Symbol
Max
12
Unit
Vdc
Vdc
Vdc
Adc
A
Collector‐Emitter Voltage
Collector‐Base Voltage
Emitter‐Base Voltage
V
CEO
V
CBO
V
EBO
12
ChipFET]
8
CASE 1206A
STYLE 4
6.0
6.0
8.0
Collector Current - Continuous
Collector Current - Peak
Electrostatic Discharge
I
C
1
I
CM
MARKING DIAGRAM
ESD
HBM Class 3B
MM Class C
VF Mꢀ
THERMAL CHARACTERISTICS
Characteristic
G
Symbol
Max
Unit
Total Device Dissipation, T = 25°C
P
D
(Note 1)
830
6.7
mW
mW/°C
A
VF = Specific Device Code
M = Month Code
Derate above 25°C
G
= Pb-Free Package
Thermal Resistance,
Junction-to-Ambient
R
(Note 1)
150
°C/W
q
JA
Total Device Dissipation, T = 25°C
P
D
(Note 2)
1.4
11.1
W
mW/°C
A
PIN CONNECTIONS
Derate above 25°C
Thermal Resistance,
Junction-to-Ambient
R
R
(Note 2)
(Note 2)
90
°C/W
°C/W
°C
q
JA
8
7
6
5
1
2
3
4
C
C
C
E
C
C
C
B
Thermal Resistance,
Junction-to-Lead #1
15
q
JL
Junction and Storage
Temperature Range
T , T
J
-55 to
+150
stg
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
ORDERING INFORMATION
2
1. FR-ā4 @ 100 mm , 1 oz copper traces.
2
†
Device
NSS12601CF8T1G
Package
Shipping
2. FR-ā4 @ 500 mm , 1 oz copper traces.
ChipFET
(Pb-Free)
3000/
Tape & Reel
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
©ꢀ Semiconductor Components Industries, LLC, 2007
May, 2007 - Rev. 1
1
Publication Order Number:
NSS12601CF8/D