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NDP04N50ZG PDF预览

NDP04N50ZG

更新时间: 2024-11-08 05:52:03
品牌 Logo 应用领域
安森美 - ONSEMI 晶体晶体管功率场效应晶体管脉冲局域网
页数 文件大小 规格书
9页 123K
描述
N-Channel Power MOSFET 500 V, 2.7 

NDP04N50ZG 技术参数

是否Rohs认证: 符合生命周期:Obsolete
零件包装代码:TO-220AB包装说明:ROHS COMPLIANT, CASE 221A-09, 3 PIN
针数:3Reach Compliance Code:compliant
ECCN代码:EAR99风险等级:5.84
Is Samacsys:N雪崩能效等级(Eas):120 mJ
外壳连接:DRAIN配置:SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压:500 V最大漏极电流 (ID):3.4 A
最大漏源导通电阻:0.0027 ΩFET 技术:METAL-OXIDE SEMICONDUCTOR
JEDEC-95代码:TO-220ABJESD-30 代码:R-PSFM-T3
元件数量:1端子数量:3
工作模式:ENHANCEMENT MODE最高工作温度:150 °C
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:FLANGE MOUNT峰值回流温度(摄氏度):NOT SPECIFIED
极性/信道类型:N-CHANNEL最大脉冲漏极电流 (IDM):14 A
认证状态:Not Qualified表面贴装:NO
端子形式:THROUGH-HOLE端子位置:SINGLE
处于峰值回流温度下的最长时间:NOT SPECIFIED晶体管元件材料:SILICON
Base Number Matches:1

NDP04N50ZG 数据手册

 浏览型号NDP04N50ZG的Datasheet PDF文件第2页浏览型号NDP04N50ZG的Datasheet PDF文件第3页浏览型号NDP04N50ZG的Datasheet PDF文件第4页浏览型号NDP04N50ZG的Datasheet PDF文件第5页浏览型号NDP04N50ZG的Datasheet PDF文件第6页浏览型号NDP04N50ZG的Datasheet PDF文件第7页 
NDP04N50Z, NDD04N50Z  
N-Channel Power MOSFET  
500 V, 2.7 W  
Features  
Low ON Resistance  
Low Gate Charge  
http://onsemi.com  
100% Avalanche Tested  
These Devices are PbFree and are RoHS Compliant  
V
DSS  
R
(MAX) @ 1.5 A  
DS(on)  
ABSOLUTE MAXIMUM RATINGS (T = 25°C unless otherwise noted)  
500 V  
2.7 W  
C
Rating  
Symbol  
NDP  
NDD  
Unit  
V
DraintoSource Voltage  
Continuous Drain Current R  
Continuous Drain Current  
V
DSS  
500  
NChannel  
I
D
I
D
3.4  
2.1  
3.0  
1.9  
A
q
JC  
D (2)  
A
R
q
JC  
, T = 100°C  
A
Pulsed Drain Current, V @ 10 V  
I
14  
75  
12  
61  
A
W
V
GS  
DM  
Power Dissipation R  
P
D
q
JC  
G (1)  
GatetoSource Voltage  
V
30  
GS  
Single Pulse Avalanche Energy,  
D
E
AS  
120  
mJ  
I
= 3.4 A  
S (3)  
ESD (HBM) (JESD22A114)  
V
2800  
V
V/ns  
A
esd  
Peak Diode Recovery  
dv/dt  
4.5 (Note 1)  
3.4  
Continuous Source Current  
(Body Diode)  
I
S
Maximum Temperature for Soldering  
Leads  
T
260  
°C  
°C  
L
4
Operating Junction and  
Storage Temperature Range  
T , T  
55 to 150  
J
stg  
4
Stresses exceeding Maximum Ratings may damage the device. Maximum  
Ratings are stress ratings only. Functional operation above the Recommended  
Operating Conditions is not implied. Extended exposure to stresses above the  
Recommended Operating Conditions may affect device reliability.  
2
1
1
2
3
IPAK  
CASE 369D  
STYLE 2  
1
3
2
3
DPAK  
CASE 369AA  
STYLE 2  
TO220AB  
CASE 221A  
STYLE 5  
1. I v 3.4 A, di/dt 200 A/ms, V BV  
, T 150°C.  
J
D
DD  
DSS  
MARKING AND ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on page 6 of this data sheet.  
© Semiconductor Components Industries, LLC, 2010  
1
Publication Order Number:  
July, 2010 Rev. 0  
NDD04N50Z/D  
 

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