MCR8DCM, MCR8DCN
Preferred Device
Silicon Controlled Rectifiers
Reverse Blocking Thyristors
Designed for high volume, low cost, industrial and consumer
applications such as motor control; process control; temperature, light
and speed control.
http://onsemi.com
Features
SCRs
8 AMPERES RMS
600 − 800 VOLTS
• Small Size
• Passivated Die for Reliability and Uniformity
• Low Level Triggering and Holding Characteristics
• Available in Surface Mount Lead Form − Case 369C
• Epoxy Meets UL 94 V−0 @ 0.125 in
G
A
K
• ESD Ratings:
Human Body Model, 3B u 8000 V
Machine Model, C u 400 V
• Pb−Free Packages are Available
4
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
J
2
1
3
Rating
Symbol
Value
Unit
Peak Repetitive Off−State Voltage
V
V
DRM,
(Note 1) (T = −40 to 125°C, Sine Wave,
DPAK
CASE 369C
STYLE 4
V
J
RRM
50 to 60 Hz, Gate Open)
MCR8DCM
600
800
MCR8DCN
On−State RMS Current
(180° Conduction Angles; T = 105°C)
I
8.0
5.1
80
A
A
A
T(RMS)
C
MARKING DIAGRAM
Average On−State Current
(180° Conduction Angles; T = 105°C)
I
T(AV)
C
YWW
CR
8DCxG
Peak Non-Repetitive Surge Current
I
TSM
(1/2 Cycle, Sine Wave 60 Hz, T = 125°C)
J
2
2
Circuit Fusing Consideration (t = 8.3 msec)
I t
26
A sec
Forward Peak Gate Power
P
5.0
W
W
A
GM
(Pulse Width ≤ 1.0 ꢀ sec, T = 105°C)
Y
= Year
C
WW
= Work Week
Forward Average Gate Power
P
0.5
2.0
G(AV)
CR8DCx = Device Code
x= M or N
(t = 8.3 msec, T = 105°C)
C
G
= Pb−Free Package
Forward Peak Gate Current
I
GM
(Pulse Width ≤ 1.0 ꢀ sec, T = 105°C)
C
Operating Junction Temperature Range
Storage Temperature Range
T
−40 to 125
−40 to 150
°C
°C
J
PIN ASSIGNMENT
Cathode
T
stg
1
2
3
4
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.
Anode
Gate
Anode
1. V
, V
for all types can be applied on a continuous basis. Ratings apply
DRM RRM
for zero or negative gate voltage; positive gate voltage shall not be applied
concurrent with negative potential on the anode. Blocking voltages shall not
be tested with a constant current source such that the voltage ratings of the
device are exceeded.
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 2 of this data sheet.
Preferred devices are recommended choices for future use
and best overall value.
©
Semiconductor Components Industries, LLC, 2005
1
Publication Order Number:
November, 2005 − Rev. 4
MCR8DCM/D