MCR8DSM, MCR8DSN
Preferred Device
Sensitive Gate
Silicon Controlled Rectifiers
Reverse Blocking Thyristors
Designed for high volume, low cost, industrial and consumer
applications such as motor control; process control; temperature, light
and speed control.
http://onsemi.com
SCRs
8 AMPERES RMS
600 − 800 VOLTS
Features
• Small Size
• Passivated Die for Reliability and Uniformity
• Low Level Triggering and Holding Characteristics
G
• Available in Two Package Styles
A
K
Surface Mount Lead Form − Case 369C
Miniature Plastic Package − Straight Leads − Case 369
• Epoxy Meets UL 94 V−0 @ 0.125 in
• ESD Ratings:
Human Body Model, 3B u 8000 V
Machine Model, C u 400 V
MARKING
DIAGRAM
• Pb−Free Packages are Available
4
YWW
CR
8DSxG
DPAK
CASE 369C
STYLE 4
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
J
Rating
Symbol
Value
Unit
1
Peak Repetitive Off−State Voltage (Note 1)
V
V
V
DRM,
RRM
(T = −40 to 110°C, Sine Wave, 50 to 60 Hz,
J
Gate Open)
MCR8DSM
MCR8DSN
600
800
Y
WW
=
=
Year
Work Week
On−State RMS Current
(180° Conduction Angles; T = 90°C)
I
8.0
5.1
90
A
A
A
T(RMS)
C
CR8DSx = Device Code
x= M or N
Average On−State Current
(180° Conduction Angles; T = 90°C)
I
T(AV)
G
= Pb−Free Package
C
Peak Non-Repetitive Surge Current
I
TSM
(1/2 Cycle, Sine Wave 60 Hz, T = 110°C)
J
2
2
Circuit Fusing Consideration (t = 8.3 msec)
I t
34
A sec
PIN ASSIGNMENT
Cathode
Forward Peak Gate Power
P
5.0
W
W
A
GM
(Pulse Width ≤ 1.0 ꢀ sec, T = 90°C)
C
1
2
3
4
Forward Average Gate Power
P
0.5
2.0
Anode
G(AV)
(t = 8.3 msec, T = 90°C)
C
Gate
Forward Peak Gate Current
I
GM
Anode
(Pulse Width ≤ 1.0 ꢀ sec, T = 90°C)
C
Operating Junction Temperature Range
Storage Temperature Range
T
−40 to 110
−40 to 150
°C
°C
J
T
stg
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 2 of this data sheet.
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.
Preferred devices are recommended choices for future use
and best overall value.
1. V
and V
for all types can be applied on a continuous basis. Ratings
DRM
RRM
apply for negative gate voltage; positive gate voltage shall not be applied
concurrent with negative potential on the anode. Blocking voltages shall not
be tested with a constant current source such that the voltage ratings of the
device are exceeded.
©
Semiconductor Components Industries, LLC, 2005
1
Publication Order Number:
November, 2005 − Rev. 4
MCR8DSM/D